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FXLS93421 bảng dữ liệu(PDF) 30 Page - NXP Semiconductors

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FXLS93421 bảng dữ liệu(HTML) 30 Page - NXP Semiconductors

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NXP Semiconductors
FXLS9xxxx
Dual channel inertial sensor
10.13 Dynamic electrical characteristics - SPI
VCC_BUF_min ≤ (VBUS_I – VSS) ≤ VCC_BUF_max, TL ≤ TA ≤ TH, ΔT ≤ 25 °C/min, unless otherwise specified
#
Characteristic
Symbol
Min
Typ
Max
Units
Test
notes
Serial Interface Timing (See Figure 97, CMISO ≤ 80 pF, RMISO ≥ 10 kΩ)
10794
Clock (SCLK) period (10 % of VCC to 10 % of VCC)
tSCLK
88
—
—
ns
6
Serial Interface Timing (See Figure 97, CMISO ≤ 80 pF, RMISO ≥ 10 kΩ)
10801
Clock (SCLK) high time (90 % of VCC to 90 % of VCC)
tSCLKH
30
—
—
ns
6
10802
Clock (SCLK) low time (10 % of VCC to 10 % of VCC)
tSCLKL
30
—
—
ns
6
Serial Interface Timing (See Figure 97, CMISO ≤ 80 pF, RMISO ≥ 10 kΩ)
10800
Clock (SCLK) rise time (10 % of VCC to 90 % of VCC)
tSCLKR
—
10
25
ns
7
10803
Clock (SCLK) fall time (90 % of VCC to 10 % of VCC)
tSCLKF
—
10
25
ns
7
Serial Interface Timing (See Figure 97, CMISO ≤ 80 pF, RMISO ≥ 10 kΩ)
10799
SS_B asserted to SCLK high (SS_B = 10 % of VCC to SCLK = 10 % of
VCC)
tLEAD
50
—
—
ns
6
Serial Interface Timing (See Figure 97, CMISO ≤ 80 pF, RMISO ≥ 10 kΩ)
10798
SS_B asserted to MISO valid (SS_B = 10 % of VCC to MISO = 10/90 %
of VCC)
tACCESS
—
—
50
ns
6
Serial Interface Timing (See Figure 97, CMISO ≤ 80 pF, RMISO ≥ 10 kΩ)
10797
Data setup time (MOSI = 10/90 % of VCC to SCLK = 10 % of VCC)
tSETUP
20
—
—
ns
6
Serial Interface Timing (See Figure 97, CMISO ≤ 80 pF, RMISO ≥ 10 kΩ)
10796
MOSI Data hold time (SCLK = 90 % of VCC to MOSI = 10/90 % of VCC)
tHOLD_IN
10
—
—
ns
6
10804
MISO Data hold time (SCLK = 90 % of VCC to MISO = 10/90 % of VCC)
tHOLD_OUT
0
—
—
ns
6
Serial Interface Timing (See Figure 97, CMISO ≤ 80 pF, RMISO ≥ 10 kΩ)
10795
SCLK low to data valid (SCLK = 10 % of VCC to MISO = 10/90 % of
VCC)
tVALID
—
—
30
ns
6
Serial Interface Timing (See Figure 97, CMISO ≤ 80 pF, RMISO ≥ 10 kΩ)
10807
SCLK low to SS_B high (SCLK = 10 % of VCC to SS_B = 90 % of VCC)
tLAG
60
—
—
ns
6
Serial Interface Timing (See Figure 97, CMISO ≤ 80 pF, RMISO ≥ 10 kΩ)
10806
SS_B high to MISO disable (SS_B = 90 % of VCC to MISO = High Z)
tDISABLE
—
—
60
ns
6
Serial Interface Timing (See Figure 97, CMISO ≤ 80 pF, RMISO ≥ 10 kΩ)
SS_B high to SS_B low (SS_B = 90 % of VCC to SS_B = 90 % of VCC)
10805
Following Sensor Data Request Commands
tSSN_SENSE
500
—
—
ns
6
10813
Following Register Reads/Writes Registers
tSSN_R
500
—
—
ns
6
10812
Following Register Write to the UF_REGION_W Register
tSSN_UF01
50
—
—
µs
6
10810
Time Between Sensor Data Requests (Same Channel, SPI Only, Arm
Enabled)
tACC_REQ_x
15
—
—
µs
6
Arming Output Activation Time (ARM0, ARM1, IARM = 200 µA)
10809
Moving Average and Count Arming Modes
tARM
0
—
1.50
µs
6
10817
Unfiltered Mode Activation Delay
tARM_UF_DLY
0
—
1.50
µs
6
10816
Unfiltered Mode Arm Assertion Time
tARM_UF_ASSERT
5.00
—
6.00
µs
6
Serial Interface Timing (See Figure 97, CMISO ≤ 80 pF, RMISO ≥ 10 kΩ)
10808
SCLK low to SS_B low (SCLK = 10 % of VCC to SS_B = 90 % of VCC)
tCLKSS
50
—
—
ns
6
Table 36. Dynamic electrical characteristics - SPI
FXLS9xxxx
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2021. All rights reserved.
Product data sheet
Rev. 6 — 8 February 2021
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