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HCS08 bảng dữ liệu(PDF) 347 Page - NXP Semiconductors |
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HCS08 bảng dữ liệu(HTML) 347 Page - NXP Semiconductors |
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347 / 374 page ![]() MC9S08JM60 Series Data Sheet, Rev. 5 Freescale Semiconductor 347 Appendix A Electrical Characteristics A.1 Introduction This appendix contains electrical and timing specifications for the MC9S08JM60 series of microcontrollers available at the time of publication. A.2 Parameter Classification The electrical parameters shown in this supplement are guaranteed by various methods. To give the customer a better understanding the following classification is used and the parameters are tagged accordingly in the tables where appropriate: NOTE The classification is shown in the column labeled “C” in the parameter tables where appropriate. A.3 Absolute Maximum Ratings Absolute maximum ratings are stress ratings only, and functional operation at the maxima is not guaranteed. Stress beyond the limits specified in Table A-2 may affect device reliability or cause permanent damage to the device. For functional operating conditions, refer to the remaining tables in this section. This device contains circuitry protecting against damage due to high static voltage or electrical fields; however, it is advised that normal precautions be taken to avoid application of any voltages higher than maximum-rated voltages to this high-impedance circuit. Reliability of operation is enhanced if unused inputs are tied to an appropriate logic voltage level (for instance, either VSS or VDD). Table A-1. Parameter Classifications P Those parameters are guaranteed during production testing on each individual device. C Those parameters are achieved by the design characterization by measuring a statistically relevant sample size across process variations. T Those parameters are achieved by design characterization on a small sample size from typical devices under typical conditions unless otherwise noted. All values shown in the typical column are within this category. D Those parameters are derived mainly from simulations. |
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