HCS08 datasheet(368/374 Pages) NXP

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Appendix A Electrical Characteristics

MC9S08JM60 Series Data Sheet, Rev. 5

368

Freescale Semiconductor

A.14 USB Electricals

The USB electricals for the S08USBV1 module conform to the standards documented by the Universal

Serial Bus Implementers Forum. For the most up-to-date standards, visit http://www.usb.org.

If the Freescale S08USBV1 implementation has electrical characteristics that deviate from the standard or

require additional information, this space would be used to communicate that information.

A.15 EMC Performance

Electromagnetic compatibility (EMC) performance is highly dependant on the environment in which the

MCU resides. Board design and layout, circuit topology choices, location and characteristics of external

components as well as MCU software operation all play a significant role in EMC performance. The

system designer must consult Freescale applications notes such as AN2321, AN1050, AN1263, AN2764,

and AN1259 for advice and guidance specifically targeted at optimizing EMC performance.

A.15.1

Radiated Emissions

Microcontroller radiated RF emissions are measured from 150 kHz to 1 GHz using the TEM/GTEM Cell

method in accordance with the IEC 61967-2 and SAE J1752/3 standards. The measurement is performed

with the microcontroller installed on a custom EMC evaluation board while running specialized EMC test

software. The radiated emissions from the microcontroller are measured in a TEM cell in two package

orientations (North and East). For more detailed information concerning the evaluation results, conditions

and setup, please refer to the EMC Evaluation Report for this device.

The maximum radiated RF emissions of the tested configuration in all orientations are less than or equal

to the reported emissions levels.

2 The frequency of this clock is controlled by a software setting.

3 These values are hardware state machine controlled. User code does not need to count cycles. This information

supplied for calculating approximate time to program and erase.

4 Typical endurance for Flash is based on the intrinsic bitcell performance. For additional information on how

Freescale Semiconductor defines typical endurance, please refer to Engineering Bulletin EB619/D, Typical

Endurance for Nonvolatile Memory.

5 Typical data retention values are based on intrinsic capability of the technology measured at high temperature and

de-rated to 25

°C using the Arrhenius equation. For additional information on how Freescale Semiconductor defines

typical data retention, please refer to Engineering Bulletin EB618/D, Typical Data Retention for Nonvolatile Memory.

Table A-17. Internal USB 3.3V Voltage Regulator Characteristics

Symbol

Unit

Min

Typ

Max

Regulator operating voltage

Vregin

3.9

—

5.5

VREG output

Vregout

3.3

3.6

VUSB33 input with internal

VREG disabled

Vusb33in

3.3

3.6

VREG Quiescent Current

IVRQ

—

0.5

—

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