XM33C321ASPZR datasheet(52/122 Pages) TI2

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7.9.1.2 ADC Switching Characteristics

over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

fADCCLK

ADC clock frequency

VDD ≥ 2.7V and VREF ≥ 2.5V

160

MHz

VDD < 2.7V or VREF < 2.5V

107

MHz

tADC trigger

Software trigger minimum width

ADCCLK

cycles

tSample

Sampling time

12-bit mode, RS = 50Ω, Cpext = 10pF

37.5

tSample_SupplyMon

Sample time with Supply Monitor

(VDD/3), (VBAT/3)

µs

7.9.1.3 ADC Linearity Parameters

over recommended ranges of supply voltage and operating free-air temperature (unless otherwise noted), all TYP values are

measured at 25

℃ and all linearity parameters are measured using 12-bit resolution mode (unless otherwise noted)(1)(2)

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Integral linearity error (INL)

External reference

-2.0

+2.0

LSB

Differential linearity error (DNL)

no missing codes

External reference

-1.0

+1.0

LSB

Offset error

External reference

-3

Internal reference, VR+ = VREF = 2.5V

Gain error

External reference

-5

LSB

Internal reference, VR+ = VREF = 2.5V

-65

LSB

(1)

Total Unadjusted Error (TUE) can be calculated from EI , EO , and EG using the following formula: TUE = √( EI2 + |EO|2 + EG2 ). All of the

errors must be converted in the same unit, usually LSB, for the above equation to be accurate.

(2)

All external reference specifications are measured with VR+ = VREF+ = VDD and VR- = VSS = 0V, external 1uF cap on VREF+ Pin,

HW Averaging feature.

7.9.1.4 Typical Connection Diagram

Vin

Rpar

Cpar

Rin

ADC Model

CS/H

Device

Boundary

12-bit SAR

Converter

Figure 7-2. ADC Input Network

1. Refer to ADC Electrical Characteristics for the values of Rin and CS/H

2. Refer to Digital IO Electrical Characteristics for the value of CI

3. Cpar and Rpar represent the parasitic capacitance and resistance of the external ADC input circuitry

Use the following equations to solve for the minimum sampling time (T) required for an ADC conversion:

1. Tau = (Rpar + Rin) × CS/H + Rpar × (Cpar + CI)

2. K= ln(2n/Settling error) – ln((Cpar + CI)/CS/H)

3. T (Min sampling time) = K × Tau

7.9.2 COMP Specifications

MSPM33C321A, MSPM33C3219

SLASFB6A – DECEMBER 2025 – REVISED SEPTEMBER 2026

www.ti.com

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Product Folder Links: MSPM33C321A MSPM33C3219

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