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XM33C321ASPZR bảng dữ liệu(PDF) 45 Page - Texas Instruments |
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XM33C321ASPZR bảng dữ liệu(HTML) 45 Page - Texas Instruments |
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45 / 122 page ![]() VDD=3.3V, VBAT=3.3V. All inputs in VDD domain tied to 0V or VDD, All inputs in VBAT Island tied to 0V or VBAT. Outputs do not source or sink any current. All peripherals not noted are disabled. PARAMETER ULPCLK -40°C 25°C 85°C 105°C 125°C UNIT TYP MAX TYP MAX TYP MAX TYP MAX TYP MAX IDD (Standby) TIMG4_0 enabled 32kHz 3.8 12 8 25 80 133 123 191 155 320 µA GPIOA enabled 3.8 12 8 25 80 133 123 191 155 320 7.5.3 SHUTDOWN Mode All inputs in VDD domain tied to 0V or VDD. Core regulator is powered down. PARAMETER VDD -40°C 25°C 85°C 105°C 125°C UNIT TYP MAX TYP MAX TYP MAX TYP MAX TYP MAX IDD (Shutdown) Supply current in SHUTDOWN mode 3.3V 54 150 100 250 2269 4600 3523 7200 5830 15000 nA 7.5.4 VBAT current consumption VDD=3.3V, VBAT=3.3V. All inputs in VDD Island tied to 0V or VDD, All inputs in VBAT Island tied to 0V or VBAT. Outputs do not source or sink any current. Core regulator is powered down. PARAMETER VDD -40°C 25°C 85°C 105°C 125°C UNIT TYP MAX TYP MAX TYP MAX TYP MAX TYP MAX IDD (VBAT) LF-XT and RTC is running 32kHz 1.4 2.2 1.6 2.2 1.9 2.5 2.1 2.7 8.5 20 µA 7.6 Flash Memory Characteristics over operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT Supply VDDPGM/ERASE Program and erase supply voltage 1.71 3.6 V IDDERASE Supply current from VDD during erase operation Supply current delta 10 mA IDDPGM Supply current from VDD during program operation Supply current delta 10 mA Endurance NWEC(CODEFLASH) Erase/program cycle endurance (code flash) 20 k cycles NWEC(DATAFLASH) (1) Erase/program cycle endurance (data flash) 100 k cycles NE(MAX) Total erase operations before failure (2) 802 k erase operations NW(MAX) Write operations per word line before sector erase(3) 83 write operations Retention tRET_85 Flash memory data retention -40°C <= Tj <= 85°C 60 years tRET_105 Flash memory data retention -40°C <= Tj <= 105°C 11.4 years tRET_130 Flash memory data retention -40°C <= Tj <= 130°C 2.4 years Program and Erase Timing tPROG (WORD, 128) Program time for flash word (4) (6) 68 µs tPROG (SEC, 128) Program time for 2kB sector (5) (6) 9.7 ms tERASE (SEC) Sector erase time ≤2k erase/program cycles, Tj ≥ 25°C 4 20 ms tERASE (SEC) Sector erase time ≤10k erase/program cycles, Tj ≥ 25°C 20 150 ms www.ti.com MSPM33C321A, MSPM33C3219 SLASFB6A – DECEMBER 2025 – REVISED SEPTEMBER 2026 Copyright © 2026 Texas Instruments Incorporated Submit Document Feedback 45 Product Folder Links: MSPM33C321A MSPM33C3219 |
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