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XM33C321ASPZR bảng dữ liệu(PDF) 45 Page - Texas Instruments

tên linh kiện XM33C321ASPZR
Giải thích chi tiết về linh kiện  MSPM33C321x Mixed-Signal Microcontrollers
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XM33C321ASPZR bảng dữ liệu(HTML) 45 Page - Texas Instruments

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VDD=3.3V, VBAT=3.3V. All inputs in VDD domain tied to 0V or VDD, All inputs in VBAT Island tied to 0V or VBAT. Outputs do
not source or sink any current. All peripherals not noted are disabled.
PARAMETER
ULPCLK
-40°C
25°C
85°C
105°C
125°C
UNIT
TYP MAX
TYP MAX
TYP MAX
TYP MAX
TYP MAX
IDD
(Standby)
TIMG4_0 enabled
32kHz
3.8
12
8
25
80
133
123
191
155
320
µA
GPIOA enabled
3.8
12
8
25
80
133
123
191
155
320
7.5.3 SHUTDOWN Mode
All inputs in VDD domain tied to 0V or VDD. Core regulator is powered down.
PARAMETER
VDD
-40°C
25°C
85°C
105°C
125°C
UNIT
TYP MAX
TYP MAX
TYP MAX
TYP MAX
TYP
MAX
IDD
(Shutdown)
Supply current in SHUTDOWN mode
3.3V
54
150
100
250 2269 4600 3523 7200 5830 15000
nA
7.5.4 VBAT current consumption
VDD=3.3V, VBAT=3.3V. All inputs in VDD Island tied to 0V or VDD, All inputs in VBAT Island tied to 0V or VBAT. Outputs do
not source or sink any current. Core regulator is powered down.
PARAMETER
VDD
-40°C
25°C
85°C
105°C
125°C
UNIT
TYP MAX TYP MAX TYP MAX TYP MAX TYP MAX
IDD (VBAT) LF-XT and RTC is running
32kHz
1.4
2.2
1.6
2.2
1.9
2.5
2.1
2.7
8.5
20
µA
7.6 Flash Memory Characteristics
over operating free-air temperature range (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Supply
VDDPGM/ERASE
Program and erase supply voltage
1.71
3.6
V
IDDERASE
Supply current from VDD during erase
operation
Supply current delta
10
mA
IDDPGM
Supply current from VDD during
program operation
Supply current delta
10
mA
Endurance
NWEC(CODEFLASH)
Erase/program cycle endurance (code
flash)
20
k cycles
NWEC(DATAFLASH)
(1)
Erase/program cycle endurance (data
flash)
100
k cycles
NE(MAX)
Total erase operations before failure (2)
802
k erase operations
NW(MAX)
Write operations per word line before
sector erase(3)
83
write operations
Retention
tRET_85
Flash memory data retention
-40°C <= Tj <= 85°C
60
years
tRET_105
Flash memory data retention
-40°C <= Tj <= 105°C
11.4
years
tRET_130
Flash memory data retention
-40°C <= Tj <= 130°C
2.4
years
Program and Erase Timing
tPROG (WORD, 128)
Program time for flash word (4) (6)
68
µs
tPROG (SEC, 128)
Program time for 2kB sector (5) (6)
9.7
ms
tERASE (SEC)
Sector erase time
≤2k erase/program cycles,
Tj ≥ 25°C
4
20
ms
tERASE (SEC)
Sector erase time
≤10k erase/program cycles,
Tj ≥ 25°C
20
150
ms
www.ti.com
MSPM33C321A, MSPM33C3219
SLASFB6A – DECEMBER 2025 – REVISED SEPTEMBER 2026
Copyright © 2026 Texas Instruments Incorporated
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Product Folder Links: MSPM33C321A MSPM33C3219



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