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SPC574Kxx
Electrical characteristics
126
3.12
Temperature sensor
The following table describes the temperature sensor electrical characteristics.
7.
Calibration of gain is possible when gain = 1.
Offset Calibration should be done with respect to 0.5*VDD_HV_ADR for differential mode and single ended mode with
negative input=0.5*VDD_HV_ADR.
Offset Calibration should be done with respect to 0 for “single ended mode with negative input=0”.
Both offset and Gain Calibration is guaranteed for ±5% variation of VDD_HV_ADR, ±10% variation of VDD_HV_ADV, and ± 50
°C temperature variation.
8.
Conversion offset error must be divided by the applied gain factor (1, 2, 4, 8, or 16) to obtain the actual input referred offset
error.
9.
This parameter is guaranteed by bench validation with a small sample of devices across process variations, and tested in
production to a value of 3 dB less.
10. S/D ADC is functional in the range 3.6 V – 4.5 V, SNR parameter degrades by 3 dB. Degraded SNR value based on
simulation.
11. S/D ADC is functional in the range 3.0 – 4.5 V, SNR parameter degrades by 9 dB. Degraded SNR value based on
simulation.
12. This parameter is guaranteed by bench validation with a small sample of devices across process variations.
13. This parameter is guaranteed by bench validation with a small sample of devices across process variations.
14. Input impedance is valid over the full input frequency range.Input impedance is calculated in megaohms by the formula
25.6/(Gain * fADCD_M).
15. SNR values guaranteed only if external noise on the ADC input pin is attenuated by the required SNR value in the
frequency range of fADCD_M – fADCD_S to fADCD_M + fADCD_S, where fADCD_M is the input sampling frequency, and fADCD_S
is the output sample frequency. A proper external input filter should be used to remove any interfering signals in this
frequency range.
16. The ±1% passband ripple specification is equivalent to 20 * log10 (0.99) = 0.087 dB.
17. Propagation of the information from the pin to the register CDR[CDATA] and flags SFR[DFEF], SFR[DFFF] is given by the
different modules that need to be crossed: delta/sigma filters, high pass filter, fifo module, clock domain synchronizers. The
time elapsed between data availability at pin and internal S/D module registers is given by the below formula:
REGISTER LATENCY = tLATENCY + 0.5/fADCD_S + 2 (~+1)/fADCD_M + 2(~+1)fPBRIDGEx_CLK
where fADCD_S is the frequency of the sampling clock, fADCD_M is the frequency of the modulator, and fPBRIDGEx_CLK
is the frequency of the peripheral bridge clock feeds to the ADC S/D module. The (~+1) symbol refers to the number of
clock cycles uncertainty (from 0 to 1 clock cycle) to be added due to resynchronization of the signal during clock domain
crossing.
Some further latency may be added by the target module (core, DMA, interrupt) controller to process the data received
from the ADC S/D module.
18. This capacitance does not include pin capacitance, that can be considered together with external capacitance, before
sampling switch.
19. Consumption is given after power-up, when steady state is reached. Extra consumption up to 2 mA may be required during
internal circuitry set-up.
Table 30. Temperature sensor electrical characteristics
Symbol
C
Parameter
Conditions
Value
Unit
Min
Typ
Max
—
CC
Temperature monitoring range
—
–40
—
150
°C
TSENS
CC
T
Sensitivity
—
—
5.18
—
mV/°C
TACC
CC
C
Accuracy
TJ  150 °C
–3
—
3
°C
ITEMP_SENS
CC
C
VDD_HV_ADV power supply
current
—
—
—
700
µA



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