CLRC63201TSLASH0FE datasheet(145/163 Pages) PHILIPS

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Philips Semiconductors

Product Specification Rev. 3.0; May 2003

Multiple Protocol Contactless Reader IC

CL RC632

145

Confidential

21.3 Analog Test-Signals

The analog test signals may be routed to pin AUX by selecting them with the register bits TestAnaOutSel.

Value

Signal Name

Description

Vmid

Voltage at internal node Vmid

Vbandgap

Internal reference voltage generated by the band gap.

VRxFollI

Output signal from the demodulator using the I-clock.

VRxFollQ

Output signal from the demodulator using the Q-clock.

VRxAmpI

I-channel subcarrier signal amplified and filtered.

VRxAmpQ

Q-channel subcarrier signal amplified and filtered.

VCorrNI

Output signal of N-channel correlator fed by the I-channel subcarrier

signal.

VCorrNQ

Output signal of N-channel correlator fed by the Q-channel subcarrier

signal.

VCorrDI

Output signal of D-channel correlator fed by the I-channel subcarrier

signal.

VCorrDQ

Output signal of D-channel correlator fed by the Q-channel subcarrier

signal.

VEvalL

Evaluation signal from the left half bit.

VEvalR

Evaluation signal from the right half bit.

VTemp

Temperature voltage derived from band gap.

rfu

Reserved for future use

rfu

Reserved for future use

rfu

Reserved for future use

Table 21-2: Analog Test Signal Selection

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