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ATF280F bảng dữ liệu(PDF) 76 Page - ATMEL Corporation |
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ATF280F bảng dữ liệu(HTML) 76 Page - ATMEL Corporation |
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76 / 107 page ![]() ATF280F [DATASHEET] 7750E −AERO−05/12 76 13.2 TAP Architecture The TAP implemented in the ATF280F consists in a TAP interface, a TAP controller and a number of shift registers including an instruction register (IR) and some other registers. Figure 13-2. AT697 TAP Architecture 13.2.1 TAP Instructions The following instructions are supported by the TAP. Table 13-2. TAP instruction set Binary Value Instruction Name Data Register Scan Chain Accessed 000 EXTEST Boundary scan register Boundary scan chain 001 SAMPLE/PRELOAD Boundary scan register Boundary scan chain 010 BYPASS Bypass register Bypass scan chain 111 IDCODE Device id register ID register scan chain 13.2.1.1 BYPASS This instruction is binary coded "010" It is used to speed up shifting at board level through components that are not to be activated. 13.2.1.2 EXTEST This instruction is binary coded "000" It is used to test connections between components at board level. Components output pins are controlled by boundary scan register during Capture DR on the rising edge of TCK. 13.2.1.3 SAMPLE/PRELOAD This instruction is binary coded "001" |
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