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TMS470MF06607 bảng dữ liệu(PDF) 44 Page - Texas Instruments

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1
ECLK
2
1
4
TCLK
TDO
TMS
TDI
1
2
3
5
TMS470MF06607
SPNS157C
– JANUARY 2012
www.ti.com
5.2.4.1
ECLK Specification
Table 5-11. Switching Characteristics Over Recommended Operating Conditions for External Clocks(1)(2)
(see Figure 5-9)
NO.
PARAMETER
TEST CONDITIONS
MIN
MAX
UNIT
Pulse duration, ECLK
Under all prescale factor combinations
1
tw(EOL)
0.5tc(ECLK) - tf
ns
low
(X and N)
Pulse duration, ECLK
Under all prescale factor combinations
2
tw(EOH)
0.5tc(ECLK) - tr
ns
high
(X and N)
(1)
X = {1,2,3,4,5,6,7,8,9,10,11,12,13,14,15,16}. X is the VBUS interface clock divider ratio determined by the CLKCNTL.[19:16] bits in the
SYS module.
(2)
N = {1 to 65536}. N is the ECP prescale value defined by the ECPCNTL.[15:0] register bits in the SYS module.
Figure 5-9. ECLK Timing Diagram
5.2.5
JTAG Timing
Table 5-12. JTAG Scan Interface Timing (JTAG Clock specification 10-MHz and 50-pF Load on TDO
Output)
(see Figure 5-10
NO.
MIN
MAX
UNIT
1
tc(JTAG)
Cycle time, JTAG low and high period
50
ns
2
tsu(TDI/TMS - TCKr)
Setup time, TDI, TMS before TCK rise (TCKr)
5
ns
3
th(TCKr -TDI/TMS)
Hold time, TDI, TMS after TCKr
5
ns
4
th(TCKf -TDO)
Hold time, TDO after TCKf
5
ns
5
td(TCKf -TDO)
Delay time, TDO valid after TCK fall (TCKf)
45
ns
Figure 5-10. JTAG Scan Timings
44
Peripheral Information and Electrical Specifications
Copyright
© 2012, Texas Instruments Incorporated
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Product Folder Link(s): TMS470MF06607



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