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TNETV2501INPGF bảng dữ liệu(PDF) 139 Page - Texas Instruments

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Electrical Specifications
139
December 2002 − Revised November 2008
SPRS206K
Transmission Line
4.0 pF
1.85 pF
Z0 = 50
Ω
(see note)
Tester Pin Electronics
Data Sheet Timing Reference Point
Output
Under
Test
NOTE: The data sheet provides timing at the device pin. For output timing analysis, the tester pin electronics and its transmission line effects
must be taken into account. A transmission line with a delay of 2 ns or longer can be used to produce the desired transmission line effect.
The transmission line is intended as a load only. It is not necessary to add or subtract the transmission line delay (2 ns or longer) from
the data sheet timings.
42
Ω
3.5 nH
Device Pin
(see note)
Input requirements in this data sheet are tested with an input slew rate of < 4 Volts per nanosecond (4 V/ns) at the device pin.
Figure 5−1. 3.3-V Test Load Circuit
5.5
Timing Parameter Symbology
Timing parameter symbols used in the timing requirements and switching characteristics tables are created
in accordance with JEDEC Standard 100. To shorten the symbols, some of the pin names and other related
terminology have been abbreviated as follows:
Lowercase subscripts and their meanings:
Letters and symbols and their meanings:
a
access time
H
High
c
cycle time (period)
L
Low
d
delay time
V
Valid
dis
disable time
Z
High impedance
en
enable time
f
fall time
h
hold time
r
rise time
su
setup time
t
transition time
v
valid time
w
pulse duration (width)
X
Unknown, changing, or don’t care level



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