STM32F101X8_10 datasheet(53/85 Pages) STMICROELECTRONICS

53 / 85 page

STM32F101x8, STM32F101xB

Electrical characteristics

Doc ID 13586 Rev 13

53/85

All I/Os are CMOS and TTL compliant (no software configuration required). Their

characteristics cover more than the strict CMOS-technology or TTL parameters. The

coverage of these requirements is shown in Figure 23 and Figure 24 for standard I/Os, and

in Figure 25 and Figure 26 for 5 V tolerant I/Os.

Table 33.

I/O static characteristics

Symbol

Parameter

Conditions

Min

Typ

Max

Unit

VIL

Standard I/O input low level

voltage

–0.5

0.28 (VDD–2)+0.8

I/O FT(1) input low level voltage

–0.5

0.32 (VDD–2)+0.75

VIH

Standard I/O input high level

voltage

0.41 (VDD–2)+1.3

VDD+0.5

I/O FT(1) input high level

voltage

0.42 (VDD–2)+1

5.5

Vhys

Standard IO Schmitt trigger

voltage hysteresis(2)

200

IO FT Schmitt trigger voltage

hysteresis(2)

5% VDD

(3)

Ilkg

Input leakage current (4)

VSS  VIN  VDD

Standard I/Os

1

µA

VIN = 5 V

I/O FT

RPU

Weak pull-up equivalent

resistor(5)

VIN VSS



RPD

Weak pull-down equivalent

resistor(5)

VIN VDD



CIO

I/O pin capacitance

FT = 5V tolerant. To sustain a voltage higher than VDD+0.5 the internal pull-up/pull-down resistors must be disabled.

Hysteresis voltage between Schmitt trigger switching levels. Based on characterization, not tested in production.

With a minimum of 100 mV.

Leakage could be higher than max. if negative current is injected on adjacent pins.

Pull-up and pull-down resistors are designed with a true resistance in series with a switchable PMOS/NMOS. This

PMOS/NMOS contribution to the series resistance is minimum (~10% order)

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