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AT697F bảng dữ liệu(PDF) 69 Page - ATMEL Corporation |
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AT697F bảng dữ liệu(HTML) 69 Page - ATMEL Corporation |
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69 / 155 page ![]() AT697F ADVANCE INFORMATION 69 7703C–AERO–6/09 Figure 44. TAP - State Machine Test Logic Reset Run Test/Idle Select DR Scan Select IR Scan Capture DR [1] Shift DR Exit_1 DR Pause DR Exit_2 DR Update DR [1] Capture IR Shift IR Exit_1 IR Pause IR Exit_2 IR Update IR 1 0 1 1 0 00 00 11 1 1 1 1 00 0 0 0 0 11 1 11 00 11 00 Transitions between states are controlled by TMS input value. Due to the scan cell layout, "Capture DR" and "Update DR" are states without associated action during the scanning of internal chains. TAP Instructions The following instruction are supported by the AT697 TAP. Table 25. TAP instruction set Binary Value Instruction Name Data Register Scan Chain Accessed 000 EXTEST Boundary scan register Boundary scan chain 001 SAMPLE/PRELOAD Boundary scan register Boundary scan chain 010 BYPASS Bypass register Bypassscan chain 111 IDCODE Device id register ID register scan chain BYPASS This instruction is binary coded "010" It is used to speed up shifting at board level through components that are not to be activated. EXTEST This instruction is binary coded "000" |
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