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ISL73141SEHF7/PROTO bảng dữ liệu(PDF) 10 Page - Renesas Technology Corp |
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ISL73141SEHF7/PROTO bảng dữ liệu(HTML) 10 Page - Renesas Technology Corp |
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10 / 30 page ![]() R34DS0012EU0504 Rev.5.04 Page 10 Sep 18, 2025 ISL73141SEH Datasheet 3.4.3 ISL73141SEHMF7 - 5.0V Operation Burn-In Deltas 3.4.4 ISL73141SEHMFN - 3.3V Operation Burn-In Deltas 3.5 Timing Specifications 3.5.1 5V Operation Digital Inputs and Outputs (PD, CS, SCK, BUSY, SDO) High Level Input VIH - 0.8×DVCC -- V Low Level Input VIL -- - 0.2×DVCC V Input Current (CS, SCK) IIN VIN = 0V to DVCC -1 - 1 µA Input Capacitance CIN -- 5 - pF High Level Output VOH DVCC - Output, IO = -500µA DVCC - 0.2 -- V Low Level Output VOL IO = 500µA - - 0.2 V Output Source Current ISRC VOUT = 0V to DVCC --10 - mA Output Sink Current ISNK VOUT = 0V to DVCC -10 - mA Hi-Z Output Leakage Current IOZ VOUT = 0V to DVCC -1 - 1 µA PD Input Resistance RINPDL Internal pull-up resistance to DVCC 400 500 600 kΩ 1. Typical values shown are not guaranteed. Values derived from +25°C median data. AVCC = 5.0V; DVCC = 2.5V, REF = 4.096V, GND = 0V, fSAMP = 1000ksps, AIN = -1dBFS; TA = +25°C; unless otherwise noted. Parameter Symbol Test Conditions Min Max Unit Integral Non-Linearity INL Measured with full scale input signal -0.35 0.35 LSB Signal to Noise Ratio SNR FIN = 105kHz -1 1 dBFS Effective Number of Bits ENOB FIN = 105kHz -0.2 0.2 bits AVCC = 3.3V; DVCC = 2.5V, REF = 3.0V, GND = 0V, fSAMP = 750ksps, AIN = -1dBFS; TA = +25°C;unless otherwise noted. Parameter Symbol Test Conditions Min Max Unit Integral Non-Linearity INL Measured with full scale input signal -0.5 0.5 LSB Signal to Noise Ratio SNR FIN = 105kHz -1 1 dBFS Effective Number of Bits ENOB FIN = 105kHz -0.2 0.2 bits Unless otherwise noted: AVCC = 4.5V to 5.5V; DVCC = 2.2V to 3.6V, REF = 4.096V, GND = 0V, fSAMP = 1Msps, AIN = -1dBFS. Boldface limits apply across the operating temperature range, -55°C to +125°C by production testings; over a total ionizing dose of 75krad(Si) at +25°C with exposure at a low dose rate of <10mrad(Si)/s. Parameter Symbol Test Conditions Min Typ[1] Max Unit Timing Characteristics Maximum Sampling Frequency fSAMP -- - 1 MHz Conversion Time tCONV BUSY Output High Time - 595 665 ns CS High Time tCSH - 40 -- ns Unless otherwise noted: AVCC = 3.3V; DVCC = 2.5V, REF = 3.0V, GND = 0V, fSAMP = 750ksps, AIN = -1dBFS. (Cont.)Boldface limits apply across the operating temperature range, -55°C to +125°C by production testings; over a total ionizing dose of 75krad(Si) at +25°C with exposure at a low dose rate of <10mrad(Si)/s. (Cont.) Parameter Symbol Test Conditions Min Typ[1] Max Unit |
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