R34DS0012EU0504 Rev.5.04

Page 8

Sep 18, 2025

ISL73141SEH Datasheet

3.4.2

ISL73141SEHMFN - 3.3V Operation

Analog Supply Current -

Static

IStatic

CS held High

-

4.3

7

mA

Analog Supply Current -

Sleep

ISLAVCC

PD held Low

-

4.8

12

µA

Digital Supply Voltage

DVCC

-

2.2

-

3.6

V

Digital Supply Current -

Active

IDVCC

fSCK = 50MHz

-

72

90

µA

Digital Supply Current -

Static

ISTDVCC

CS held High

-

26.4

35

µA

Digital Supply Current -

Sleep

ISLDVCC

PD held Low

-

6

8

µA

PD

PACTIVE

Sample rate = 1Msps

-

60

72.8

mW

PSTATIC

CS held High

-

21.6

35.1

mW

PSLEEP

PD held Low

-

39

80

µW

Digital Inputs and Outputs (PD, CS, SCK, BUSY, SDO)

High Level Input

VIH

-

0.8×DVCC

--

V

Low Level Input

VIL

--

-

0.2×DVCC

V

Input Current (CS, SCK)

IIN

VIN = 0V to DVCC

-1

-

1

µA

Input Capacitance

CIN

--

5

-

pF

High Level Output

VOH

DVCC - Output, IO = -500µA

DVCC - 0.2

--

V

Low Level Output

VOL

IO = 500µA

-

-

0.2

V

Output Source Current

ISRC

VOUT = 0V to DVCC

--10

-

mA

Output Sink Current

ISNK

VOUT = 0V to DVCC

-10

-

mA

Hi-Z Output Leakage

Current

IOZ

VOUT = 0V to DVCC

-1

1

µA

PD Input Resistance

RINPDL

Internal pull-up resistance to DVCC

400

500

600

kΩ

1. Typical values shown are not guaranteed. Values derived from +25°C median data.

Unless otherwise noted: AVCC = 3.3V; DVCC = 2.5V, REF = 3.0V, GND = 0V, fSAMP = 750ksps, AIN = -1dBFS. Boldface limits apply across

the operating temperature range, -55°C to +125°C by production testings; over a total ionizing dose of 75krad(Si) at +25°C with

exposure at a low dose rate of <10mrad(Si)/s.

Parameter

Symbol

Test Conditions

Min

Typ[1]

Max

Unit

Converter Characteristics

Resolution

-

-

14

--

bits

No Missing Codes

-

-

14

--

bits

Transition Noise

-

RMS noise, 14-bit LSB

-

0.4

-

LSBRM

S

Integral Non-Linearity

INL

Measured with full scale input signal

-1.5

±0.5

1.5

LSB

Differential Non-Linearity

DNL

Measured with full scale input signal

-0.5

±0.25

0.5

LSB

Zero Scale Error

VOFF

Measured with input grounded

-5

0

5

LSB

Unless otherwise noted: AVCC = 5.0V; DVCC = 2.5V, REF = 4.096V, GND = 0V, fSAMP = 1Msps, AIN = -1dBFS.Boldface limits apply across

the operating temperature range, -55°C to +125°C by production testings; over a total ionizing dose of 75krad(Si) at +25°C with

exposure at a low dose rate of <10mrad(Si)/s. (Cont.)

Parameter

Symbol

Test Conditions

Min

Typ[1]

Max

Unit