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CS5376A bảng dữ liệu(PDF) 76 Page - Cirrus Logic |
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CS5376A bảng dữ liệu(HTML) 76 Page - Cirrus Logic |
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76 / 107 page ![]() CS5376A 76 21. BOUNDARY SCAN JTAG The CS5376A includes an IEEE 1149.1 boundary scan JTAG port to test PCB interconnections. Refer to the IEEE 1149.1 specification for more informa- tion about boundary scan testing. 21.1 Pin Descriptions TRST - Pin 1 Reset input for the test access port (TAP) controller and all boundary scan cells, active low. Connect to GND to disable the JTAG port. TMS - Pin 2 Serial input to select the JTAG test mode. TCK - Pin 3 Clock input to the TAP controller. TDI - Pin 4 Serial input to the scan chain or TAP controller. TDO - Pin 5 Serial output from the scan chain or TAP control- ler. 21.2 JTAG Architecture The JTAG test circuitry consists of a test access port (TAP) controller and boundary scan cells con- nected to each pin. The boundary scan cells are linked together to create a scan chain around the CS5376A. 21.2.1 JTAG Reset As required by the IEEE 1149.1 specification, the JTAG TRST signal is independent of the CS5376A RESET signal. In systems not using the JTAG port, TRST should be connected to ground. In systems using the JTAG port, TRST and RESET should be independently driven to provide reset capability during boundry scan. 21.2.2 TAP Controller The test access port (TAP) controller manages commands and data through the boundary scan chain. It supports the four JTAG instructions and contains the IDCODE listed in Table 18. The TAP controller also implements the 16 JTAG state assignments from the IEEE 1149.1 specifica- tion, which are sequenced using TMS and TCK. Figure 42. JTAG Block Diagram TDI TDO Controller TAP TRST TMS TCK Boundary Scan Cells |
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