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CS5376A bảng dữ liệu(PDF) 76 Page - Cirrus Logic

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CS5376A
76
21. BOUNDARY SCAN JTAG
The CS5376A includes an IEEE 1149.1 boundary
scan JTAG port to test PCB interconnections. Refer
to the IEEE 1149.1 specification for more informa-
tion about boundary scan testing.
21.1 Pin Descriptions
TRST - Pin 1
Reset input for the test access port (TAP) controller
and all boundary scan cells, active low. Connect to
GND to disable the JTAG port.
TMS - Pin 2
Serial input to select the JTAG test mode.
TCK - Pin 3
Clock input to the TAP controller.
TDI - Pin 4
Serial input to the scan chain or TAP controller.
TDO - Pin 5
Serial output from the scan chain or TAP control-
ler.
21.2 JTAG Architecture
The JTAG test circuitry consists of a test access
port (TAP) controller and boundary scan cells con-
nected to each pin. The boundary scan cells are
linked together to create a scan chain around the
CS5376A.
21.2.1 JTAG Reset
As required by the IEEE 1149.1 specification, the
JTAG TRST signal is independent of the CS5376A
RESET signal. In systems not using the JTAG port,
TRST should be connected to ground. In systems
using the JTAG port, TRST and RESET should be
independently driven to provide reset capability
during boundry scan.
21.2.2 TAP Controller
The test access port (TAP) controller manages
commands and data through the boundary scan
chain. It supports the four JTAG instructions and
contains the IDCODE listed in Table 18.
The TAP controller also implements the 16 JTAG
state assignments from the IEEE 1149.1 specifica-
tion, which are sequenced using TMS and TCK.
Figure 42. JTAG Block Diagram
TDI
TDO
Controller
TAP
TRST
TMS
TCK
Boundary Scan Cells



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