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PCF2127AT/1 bảng dữ liệu(PDF) 50 Page - NXP Semiconductors

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Giải thích chi tiết về linh kiện  Integrated RTC, TCXO and quartz crystal
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PCF2127AT/1 bảng dữ liệu(HTML) 50 Page - NXP Semiconductors

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PCF2127A_2
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2010. All rights reserved.
Product data sheet
Rev. 02 — 7 May 2010
50 of 80
NXP Semiconductors
PCF2127A
Integrated RTC, TCXO and quartz crystal
8.13.6 Timestamp interrupts
Interrupt generation from the timestamp function is controlled using the TSIE bit (register
Control_2). If TSIE is enabled the INT pin follows the status of the flags TSFx. Clearing
the flags TSFx immediately clears INT. No pulse generation is possible for timestamp
interrupts.
8.13.7 Battery switch-over interrupts
Generation of interrupts from the battery switch-over is controlled via the BIE bit (register
Control_3). If BIE is enabled, the INT pin follows the status of bit BF in register Control_3
(see Table 52). Clearing BF immediately clears INT. No pulse generation is possible for
battery switch-over interrupts.
8.13.8 Battery low detection interrupts
Generation of interrupts from the battery low detection is controlled via the BLIE bit
(register Control_3). If BLIE is enabled the INT pin will follow the status of bit BLF (register
Control_3). The interrupt is cleared when the battery is replaced (BLF is logic 0) or when
bit BLIE is disabled (BLIE is logic 0). BLF is read only and therefore cannot be cleared via
the interface.



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