ECE1200 datasheet(12/87 Pages) MICROCHIP

tên linh kiện	ECE1200

Giải thích chi tiết về linh kiện	eSPI to LPC Bridge

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ECE1200

DS00003093C Draft-page 12

 2018-2021 Microchip Technology Inc.

2.3

Strapping Options

2.3.1

TEST PIN

The pin named TEST must be kept permanently low in normal operation. It may be pulled high only for test purposes,

and when high it redefines all pin functions. See Section 7.0, "Test Mechanisms," on page 58.

2.3.2

ESPI_STRAP_0, ESPI_STRAP_1 PINS

These pins should remain open (N/C) except for test purposes. They are included as inputs to the XNOR Chain test

mode.

2.3.3

BOOT_DONE PIN

This pin defines whether the eSPI role of the ECE1200 is as a Primary Slave or a Secondary Slave. It may be strapped

in the system, or it may be dynamically changed (once) in the power-on sequence.

The state of BOOT_DONE selects the multiplexed output function of pin SUSPWRDNACK / HOST_RST_ACK:

• BOOT_DONE=1: SUSPWRDNACK

• BOOT_DONE=0: HOST_RST_ACK

See Section 5.5.2, "BOOT_DONE," on page 27 for details of its usage. See also the figures in Section 1.1, "System

Block Diagrams," on page 5 for connection examples and notes for application.

ECE1200 bảng dữ liệu(PDF) 12 Page - Microchip Technology