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TMS570LS0332PZ bảng dữ liệu(PDF) 41 Page - Texas Instruments

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f[MHz]
1.375
4.875
22
78
fail
lower
threshold
pass
upper
threshold
fail
TMS570LS0432, TMS570LS0332
www.ti.com
SPNS186B – OCTOBER 2012 – REVISED JUNE 2015
6.6
Clock Monitoring
The LPO Clock Detect (LPOCLKDET) module consists of a clock monitor (CLKDET) and an internal low-
power oscillator (LPO).
The LPO provides two different clock sources – a low frequency (LFLPO) and a high frequency (HFLPO).
The CLKDET is a supervisor circuit for an externally supplied clock signal (OSCIN). In case the OSCIN
frequency falls out of a frequency window, the CLKDET flags this condition in the global status register
(GLBSTAT bit 0: OSC FAIL) and switches all clock domains sourced by OSCIN to the HFLPO clock (limp
mode clock).
The valid OSCIN frequency range is defined as: fHFLPO / 4 < fOSCIN < fHFLPO * 4.
6.6.1
Clock Monitor Timings
For more information on LPO and Clock detection, refer to Table 6-10.
Figure 6-8. LPO and Clock Detection, Untrimmed HFLPO
6.6.2
External Clock (ECLK) Output Functionality
The ECLK pin can be configured to output a prescaled clock signal indicative of an internal device clock.
This output can be externally monitored as a safety diagnostic.
6.6.3
Dual Clock Comparator
The Dual Clock Comparator (DCC) module determines the accuracy of selectable clock sources by
counting the pulses of two independent clock sources (counter 0 and counter 1). If one clock is out of
spec, an error signal is generated. For example, the DCC can be configured to use CLK10M as the
reference clock (for counter 0) and VCLK as the "clock under test" (for counter 1). This configuration
allows the DCC to monitor the PLL output clock when VCLK is using the PLL output as its source.
6.6.3.1
Features
•
Takes two different clock sources as input to two independent counter blocks.
•
One of the clock sources is the known-good, or reference clock; the second clock source is the "clock under test."
•
Each counter block is programmable with initial, or seed values.
•
The counter blocks start counting down from their seed values at the same time; a mismatch from the expected
frequency for the clock under test generates an error signal which is used to interrupt the CPU.
6.6.3.2
Mapping of DCC Clock Source Inputs
Table 6-14. DCC Counter 0 Clock Sources
TEST MODE
CLOCK SOURCE [3:0]
CLOCK NAME
Others
Oscillator (OSCIN)
0
0x5
High-frequency LPO
0xA
Test clock (TCK)
1
X
VCLK
Copyright © 2012–2015, Texas Instruments Incorporated
System Information and Electrical Specifications
41
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Product Folder Links: TMS570LS0432 TMS570LS0332



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