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PI7C8150BMA-33 bảng dữ liệu(PDF) 17 Page - Pericom Semiconductor Corporation |
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PI7C8150BMA-33 bảng dữ liệu(HTML) 17 Page - Pericom Semiconductor Corporation |
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17 / 107 page ![]() PI7C8150B ASYNCHRONOUS 2-PORT PCI-TO-PCI BRIDGE Page 17 of 107 April 2015 – Revision 2.1 CFG66 / SCAN_EN_H / CLK_RATE 125 K16 I This is a multiplexed pin that has 3 functions (2 in synchronous mode and 1 in asynchronous mode). CFG66 - 66MHz Configuration (synchronous mode): This pin is used to designate 66MHz operation. Tie HIGH to enable 66MHz operation or tie LOW to designate 33MHz operation. SCAN_EN_H - Full-Scan Enable Control (synchronous mode): When SCAN_EN_H is LOW, full-scan is in shift operation. When SCAN_EN_H is HIGH, full-scan is in parallel operation. Note: Valid only in test mode. Pin is CFG66 in normal operation. CLK_RATE – S_CLKOUT divider (asynchronous mode): Determines the S_CLKOUT frequency relation to ASYNC_CLK_IN. 0: S_SCLKOUT is half the frequency of ASYNC_CLK_IN. 1: S_CLKOUT is the same frequency as ASYNC_CLK_IN. MS0, MS1 155, 106 B14, R16 I Mode Selection: Selector for Asynchronous or Synchronous mode. MS0 MS1 Description 0 0 RESERVED 0 1 RESERVED 1 0 Synchronous Mode 1 1 Asynchronous Mode 2.2.5 GENERAL PURPOSE I/O INTERFACE SIGNALS Name Pin # Pin # Type Description GPIO[3:0] 24, 25, 27, 28 J3, J2, J1, K1 TS General Purpose I/O Data Pins: The 4 general- purpose signals are programmable as either input-only or bi-directional signals by writing the GPIO output enable control register in the configuration space. 2.2.6 JTAG BOUNDARY SCAN SIGNALS Name Pin # Pin # Type Description TCK 133 H15 I Test Clock. Used to clock state information and data into and out of the PI7C8150B during boundary scan. TMS 132 H14 I Test Mode Select. Used to control the state of the Test Access Port controller. TDO 130 H16 O Test Data Output. When SCAN_EN_H is HIGH, it is used (in conjunction with TCK) to shift data out of the Test Access Port (TAP) in a serial bit stream. TDI 129 J15 I Test Data Input. When SCAN_EN_H is HIGH, it is used (in conjunction with TCK) to shift data and instructions into the Test Access Port (TAP) in a serial bit stream. TRST_L 134 G15 I Test Reset. Active LOW signal to reset the Test Access Port (TAP) controller into an initialized state. 15-0048 |
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