ASI4U datasheet(10/71 Pages) RENESAS

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ASI4U / ASI4U-E / ASI4U-F Datasheet

January 26, 2016

2.2.

Operating Conditions

Table 2.2

Operating Conditions

PARAMETER

SYMBOL

CONDITIONS

MIN

MAX.

UNIT

Positive supply voltage for IC operation

VUIN

DC parameter:

VUINmin = VUOUTmin + VDROPmax

VUINmax = VUOUTmax + VDROPmin

33.1

Negative supply voltage

V0V, VGND

DC voltage at ASIP

VASIP

Relative to V0V

33.1

DC voltage at ASIN

VASIN

Relative to V0V

-4

Operating current

IUIN

VUIN = 30V

fc = 8.000 MHz; no load at any

pin; transmitter turned off; digital

State Machine is in idle state

Maximum output sink current at DO0, DO1, DO2,

DO3, and DSR pins

ICL1

Maximum output sink current at P0, P1, P2, P3,

and PST pins

ICL2

Ambient temperature range, operating range

ASI4U

-25

°C

ASI4U-E

-25

105

°C

ASI4U-F

-40

°C

Below VUINmin, the power supply block might not be able to provide the specified output currents at UOUT and U5R.

Outside the maximum and minimum limits, the send current shape and send current amplitude cannot be guaranteed.

Table 2.3

Crystal Frequency

PARAMETER

SYMBOL

CONDITIONS

NOMINAL

UNIT

Crystal frequency

8.000/16.000

MHz

The IC automatically detects whether the crystal frequency is 8.000MHz or 16.000MHz and controls the internal clock circuit

accordingly. The frequency detection is locked as soon as one AS-i telegram has been correctly received at any input channel.

It can be reset by a power-on reset only.

Note: In Slave Mode, the locking occurs if a Master Call has been received. In the Master, Repeater, or Monitor Modes, a Master

Call or a Slave Response that has been received on any input channel triggers the frequency locking.

The ASI4U/ASI4U-E/ASI4U-F supports an integrated clock watchdog. If no crystal or clock oscillation is recog-

nized for 150µs, the IC generates a RESET event until clock oscillation is available. More detailed oscillator pin

definitions can be found in section 4.10.

2.3. Quality Standards

The quality of the ASI4U/ASI4U-E/ASI4U-F is ensured according to the IDT quality standards. Functional device

parameters are valid for device operating conditions specified in section 2.2. Unless otherwise stated, production

device tests are performed at Ta = +25°C within the recommended ranges of (VASIP - VASIN) and (VIN - V0V).

Additional sample base testing is done at +85°C and -25°C (-40°C for the ASI4U-F).

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