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FXLS8964AF bảng dữ liệu(PDF) 50 Page - NXP Semiconductors

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FXLS8964AF bảng dữ liệu(HTML) 50 Page - NXP Semiconductors

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NXP Semiconductors
FXLS8964AF
3-Axis Low-g Accelerometer
FXLS8964AF
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2020. All rights reserved.
Objective data sheet
Rev. 2 — 30 October 2020
50 / 98
Field
Description
6:5
ST_AXIS_SEL[1:0]
Self-test axis selection
This bit field selects the transducer axis to test using the Self-Test function. The ST_POL bit allows
either positive or negative self-test displacements to be applied.
The host system may use the self-test function to verify the functionality of both the transducer and
signal measurement chain without the need to apply an external acceleration stimulus.
Notes:
• The data output from the two axes that are not selected by ST_AXIS_SEL during the self-test
sequence are not meaningful and should be ignored.
• It is recommended to minimize the communication traffic on the device serial interface during the
measurement phase in order to reduce the susceptibility of the self-test response signal to induced
noise. Hence, it is strictly recommended to operate Self-test in interrupt mode.
00b: (default): Self-test function is disabled
01b: Self-test function is enabled for X-axis
10b: Self-test function is enabled for Y-axis
11b: Self-test function is enabled for Z-axis
4
ST_POL
Self-test displacement polarity
0 (default): Proof mass displacement for the selected axis is in the positive direction.
1: Proof mass displacement for the selected axis is in the negative direction.
3
SPI_M
SPI interface mode selection; selects between 3- and 4-wire operating modes for the SPI interface:
0 (default): 4-wire interface mode is selected
1: 3-wire interface mode is selected
Notes:
• The state of this bit is only relevant when the SPI interface mode is selected (INTF_SEL = VDD).
• When INTF_SEL = VDD and SPI_M = 1, the SDA/SPI_MOSI pin becomes the bi-directional
SPI_DATA pin; the SA0/MISO pin is unused and placed in a high-impedance state.
• 4-wire mode is selected by default after a POR/BOR event or when exiting Hibernate mode.
• If INTF_SEL = VDD and the SPI_MOSI and SPI_MISO lines are directly connected together on the
PCB, 3-wire SPI mode is enabled regardless of the setting of this bit
2:1
FSR[1:0]
Full-scale measurement range (FSR) selection
00b: ±2 g; 0.98 mg/LSB (1024 LSB/g) nominal sensitivity
01b (default): ±4 g; 1.95 mg/LSB (512 LSB/g) nominal sensitivity
10b: ±8 g; 3.91 mg/LSB (256 LSB/g) nominal sensitivity
11b: ±16 g; 7.81 mg/LSB (128 LSB/g) nominal sensitivity
0
ACTIVE
Standby/Active mode selection
This bit selects between Standby mode and Active mode.
Note:
• When INT2_FUNC = 1, the Active bit becomes read only via the I2C or SPI interface as the INT2
pin logic state directly controls the device operating mode. The INT2_FUNC may only be enabled
(set to 1) when ACTIVE = 0. Similarly, the ACTIVE bit may only be set if INT2_FUNC = 0.
0: FXLS8964AF is placed in Standby mode and draws the minimum amount of current on the VDD pin
(IDD-STBY). This is the default mode after a POR or soft reset event.
1: FXLS8964AF is placed in Active mode and draws an IDD corresponding to the selected ODR in
HPM, the selected ODR in LPM, or the user-selected decimation and idle time settings in FPM.



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