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FXLS8964AF bảng dữ liệu(PDF) 50 Page - NXP Semiconductors |
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FXLS8964AF bảng dữ liệu(HTML) 50 Page - NXP Semiconductors |
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50 / 98 page ![]() NXP Semiconductors FXLS8964AF 3-Axis Low-g Accelerometer FXLS8964AF All information provided in this document is subject to legal disclaimers. © NXP B.V. 2020. All rights reserved. Objective data sheet Rev. 2 — 30 October 2020 50 / 98 Field Description 6:5 ST_AXIS_SEL[1:0] Self-test axis selection This bit field selects the transducer axis to test using the Self-Test function. The ST_POL bit allows either positive or negative self-test displacements to be applied. The host system may use the self-test function to verify the functionality of both the transducer and signal measurement chain without the need to apply an external acceleration stimulus. Notes: • The data output from the two axes that are not selected by ST_AXIS_SEL during the self-test sequence are not meaningful and should be ignored. • It is recommended to minimize the communication traffic on the device serial interface during the measurement phase in order to reduce the susceptibility of the self-test response signal to induced noise. Hence, it is strictly recommended to operate Self-test in interrupt mode. 00b: (default): Self-test function is disabled 01b: Self-test function is enabled for X-axis 10b: Self-test function is enabled for Y-axis 11b: Self-test function is enabled for Z-axis 4 ST_POL Self-test displacement polarity 0 (default): Proof mass displacement for the selected axis is in the positive direction. 1: Proof mass displacement for the selected axis is in the negative direction. 3 SPI_M SPI interface mode selection; selects between 3- and 4-wire operating modes for the SPI interface: 0 (default): 4-wire interface mode is selected 1: 3-wire interface mode is selected Notes: • The state of this bit is only relevant when the SPI interface mode is selected (INTF_SEL = VDD). • When INTF_SEL = VDD and SPI_M = 1, the SDA/SPI_MOSI pin becomes the bi-directional SPI_DATA pin; the SA0/MISO pin is unused and placed in a high-impedance state. • 4-wire mode is selected by default after a POR/BOR event or when exiting Hibernate mode. • If INTF_SEL = VDD and the SPI_MOSI and SPI_MISO lines are directly connected together on the PCB, 3-wire SPI mode is enabled regardless of the setting of this bit 2:1 FSR[1:0] Full-scale measurement range (FSR) selection 00b: ±2 g; 0.98 mg/LSB (1024 LSB/g) nominal sensitivity 01b (default): ±4 g; 1.95 mg/LSB (512 LSB/g) nominal sensitivity 10b: ±8 g; 3.91 mg/LSB (256 LSB/g) nominal sensitivity 11b: ±16 g; 7.81 mg/LSB (128 LSB/g) nominal sensitivity 0 ACTIVE Standby/Active mode selection This bit selects between Standby mode and Active mode. Note: • When INT2_FUNC = 1, the Active bit becomes read only via the I2C or SPI interface as the INT2 pin logic state directly controls the device operating mode. The INT2_FUNC may only be enabled (set to 1) when ACTIVE = 0. Similarly, the ACTIVE bit may only be set if INT2_FUNC = 0. 0: FXLS8964AF is placed in Standby mode and draws the minimum amount of current on the VDD pin (IDD-STBY). This is the default mode after a POR or soft reset event. 1: FXLS8964AF is placed in Active mode and draws an IDD corresponding to the selected ODR in HPM, the selected ODR in LPM, or the user-selected decimation and idle time settings in FPM. |
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