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SPC564A80L7 bảng dữ liệu(PDF) 115 Page - STMicroelectronics

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SPC564A74L7, SPC564A80B4, SPC564A80L7
Electrical characteristics
Doc ID 15399 Rev 9
115/157
3.17.2
IEEE 1149.1 interface timing
Note:
The Nexus/JTAG Read/Write Access Control/Status Register (RWCS) write (to begin a read
access) or the write to the Read/Write Access Data Register (RWD) (to begin a write
access) does not actually begin its action until 1 JTAG clock (TCK) after leaving the JTAG
Update-DR state. This prevents the access from being performed and therefore will not
signal its completion via the READY (RDY) output unless the JTAG controller receives an
additional TCK. In addition, EVTI is not latched into the device unless there are clock
transitions on TCK.
The tool/debugger must provide at least one TCK clock for the EVTI signal to be recognized
by the MCU. When using the RDY signal to indicate the end of a Nexus read/write access,
ensure that TCK continues to run for at least 1 TCK after leaving the Update-DR state. This
can be just a TCK with TMS low while in the Run-Test/Idle state or by continuing with the
Table 38.
JTAG pin AC electrical characteristics(1)
#
Symbol
C
Characteristic
Min.
Value
Max.
Value
Unit
1tJCYC
CC
D
TCK Cycle Time
100
—
ns
2tJDC
CC
D
TCK Clock Pulse Width
40
60
ns
3tTCKRISE
CC
D
TCK Rise and Fall Times (40% -
70%)
—3
ns
4tTMSS, tTDIS
CC
D
TMS, TDI Data Setup Time
5
—
ns
5tTMSH, tTDIH
CC
D
TMS, TDI Data Hold Time
25
—
ns
6tTDOV
CC
D
TCK Low to TDO Data Valid
—
22(2)
ns
7tTDOI
CC
D
TCK Low to TDO Data Invalid
0
—
ns
8tTDOHZ
CC
D
TCK Low to TDO High Impedance
—
22
ns
9tJCMPPW
CC
D
JCOMP Assertion Time
100
—
ns
10
tJCMPS
CC
D
JCOMP Setup Time to TCK Low
40
—
ns
11
tBSDV
CC
D
TCK Falling Edge to Output Valid
—
50
ns
12
tBSDVZ
CC
D
TCK Falling Edge to Output Valid out
of High Impedance
—50
ns
13
tBSDHZ
CC
D
TCK Falling Edge to Output High
Impedance
—50
ns
14
tBSDST
CC
D
Boundary Scan Input Valid to TCK
Rising Edge
25(3)
—ns
15
tBSDHT
CC
D
TCK Rising Edge to Boundary Scan
Input Invalid
25(3)
—ns
1.
JTAG timing specified at VDD = 1.14 V to 1.32 V, VDDEH = 4.5 V to 5.5 V with multi-voltage pads programmed to Low-
Swing mode, TA = TL to TH, and CL = 30 pF with DSC = 0b10, SRC = 0b11. These specifications apply to JTAG boundary
scan only. See Table 39 for functional specifications.
2.
Pad delay is 8–10 ns. Remainder includes TCK pad delay, clock tree delay logic delay and TDO output pad delay.
3.
For 20 MHz TCK.



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