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TMS470MF06607 bảng dữ liệu(PDF) 33 Page - Texas Instruments

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TMS470MF06607
www.ti.com
SPNS157C
– JANUARY 2012
4.3
Electrical Characteristics Over Recommended Operating Free-Air Temperature
Range, Q Version
(1) (2)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Vhys
Input hysteresis
150
mV
VIL
All inputs(3)
-0.3
0.8
V
Low-level input
voltage
OSCIN
0.2 VCC
V
VIH
VCCIOR +
All inputs(3)
2
High-level input
0.3
V
voltage
OSCIN
0.8 VCC
VOL
IOL = IOL MAX
0.2 VCCIOR
IOL = 50 µA
0.2
Standard mode
Low-level output voltage
V
IOL = 50 µA
Impedance Control
0.2 VCCIOR
mode
VOH
IOH = IOH MAX
0.8 VCCIOR
IOH = 50 µA
VCCIOR -0.2
Standard mode
High-level output voltage
V
IOH = 50 µA
Impedance Control
0.8 VCCIOR
mode
IIC
VI < VSSIO - 0.3 or VI
Input clamp current (I/O pins)(4)
-2
2
mA
> VCCIOR + 0.3
II
IIH Pulldown
VI = VCCIOR
45
190
Input current (I/O
IIL Pullup
VI = VSS
-190
-45
µA
pins)
No pullup or
All other pins
-1
1
pulldown
IOL
Low-level output
Adaptive Impedance 4 mA VOL = VOL MAX
4
mA
tcurrent
Buffer
IOH
High-level output
Adaptive Impedance 4 mA VOH = VOH MIN
-4
mA
current
Buffer
ICC
HCLK = 80 MHz,
VCC digital supply current (operating mode,
VCLK = 80 MHz,
115
mA
internal regulator disabled)
VCC = 1.70 V
(5)
(1)
Source currents (out of the device) are negative while sink currents (into the device) are positive.
(2)
"All frequencies" will include all specified device configuration frequencies.
(3)
The VIL here does not apply to the OSCIN, and PORRST pins; the VIH here does not apply to the OSCIN, and RST pins; For RST and
PORRST exceptions, see Section 5.1.
(4)
Parameter does not apply to input-only or output-only pins.
(5)
Maximum currents are measured using a system-level test case. This test case exercises all of the device peripherals concurrently
(excluding MBIST and STC LBIST).
Copyright
© 2012, Texas Instruments Incorporated
Device Operating Conditions
33
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