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SPC5644AF0MLU2 bảng dữ liệu(PDF) 71 Page - Freescale Semiconductor, Inc

tên linh kiện SPC5644AF0MLU2
Giải thích chi tiết về linh kiện  MPC5644A Microcontroller Data Sheet
PDF  138 Pages
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SPC5644AF0MLU2 bảng dữ liệu(HTML) 71 Page - Freescale Semiconductor, Inc

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MPC5644A Microcontroller Data Sheet, Rev. 7
Freescale Semiconductor
71
•
B. Joiner and V. Adams, “Measurement and Simulation of Junction to Board Thermal Resistance and Its Application
in Thermal Modeling,” Proceedings of SemiTherm, San Diego, 1999, pp. 212-220.
3.4
EMI (electromagnetic interference) characteristics
3.5
Electrostatic discharge (ESD) characteristics
Table 12. EMI Testing Specifications1
1 EMI testing and I/O port waveforms per SAE J1752/3 issued 1995-03 and IEC 61967-2.
Symbol
Parameter
Conditions
Clocks
Frequency
Range
Level
(Max)
Unit
Radiated
emissions,
electric field
VRE_TEM
VDDREG =5.25V;
TA =25°C
150 kHz – 30 MHz
RBW 9 kHz, Step
Size 5 kHz
30 MHz – 1 GHz -
RBW 120 kHz, Step
Size 80 kHz
16 MHz crystal
40 MHz bus
No PLL frequency
modulation
150 kHz – 50 MHz
20
dB
V
50 – 150 MHz
20
150 – 500 MHz
26
500 – 1000 MHz
26
IEC Level
K
—
SAE Level
3
—
16 MHz crystal
40 MHz bus
±2% PLL
frequency
modulation
150 kHz– 50 MHz
13
dB
V
50 – 150 MHz
13
150 – 500 MHz
11
500 – 1000 MHz
13
IEC Level
L
—
SAE Level
2
—
Table 13. ESD ratings1,2
1 All ESD testing is in conformity with CDF-AEC-Q100 Stress Test Qualification for Automotive Grade Integrated
Circuits.
Symbol
Parameter
Conditions
Value
Unit
—
SR
ESD for Human Body Model (HBM)
—
2000
V
R1
SR
HBM circuit description
—
1500
CSR
—
100
pF
—
SR
ESD for field induced charge Model
(FDCM)
All pins
500
V
Corner pins
750
—
SR
Number of pulses per pin
Positive pulses (HBM)
1
—
Negative pulses (HBM)
1
—
—
SR
Number of pulses
—
1
—



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