STM32F303X6 datasheet(95/124 Pages) STMICROELECTRONICS

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DS9866 Rev 8

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STM32F303x6/x8

Electrical characteristics

102

Figure 30. ADC accuracy characteristics

Table 64. ADC accuracy(1)(2) at 1MSPS

Symbol

Parameter

Test conditions

Typ.

Max(3)

Unit

Total unadjusted error

ADC Freq. ≤ 72 MHz

Sampling Freq. ≤ 1MSPS

2 V ≤ VDDA = VREF+ ≤ 3.6 V

Single-ended mode

Fast channel

±2.5

±5

LSB

Slow channel

±3.5

±5

Offset error

Fast channel

±1

±2.5

Slow channel

±1.5

±2.5

Gain error

Fast channel

±2

±3

Slow channel

±3

±4

Differential linearity error

Fast channel

±0.7

± 2

Slow channel

±0.7

±2

Integral linearity error

Fast channel

±1

±3

Slow channel

±1.2

±3

1. ADC DC accuracy values are measured after internal calibration.

2. ADC accuracy vs. negative Injection Current: Injecting negative current on any analog input pins must be avoided as this

significantly reduces the accuracy of the conversion being performed on another analog input. It is recommended to add a

Schottky diode (pin to ground) to analog pins which may potentially inject negative current. Any positive injection current

within the limits specified for IINJ(PIN) and ∑IINJ(PIN) in Section 6.3.14: I/O port characteristics does not affect the ADC

accuracy.

3. Data based on characterization results, not tested in production.

1LSBIDEAL

(1) Example of an actual transfer curve

(2) The ideal transfer curve

(3) End point correlation line

ET=Total Unadjusted Error: maximum deviation

between the actual and the ideal transfer curves.

EO=Offset Error: deviation between the first actual

transition and the first ideal one.

EG=Gain Error: deviation between the last ideal

transition and the last actual one.

ED=Differential Linearity Error: maximum deviation

between actual steps and the ideal one.

EL=Integral Linearity Error: maximum deviation

between any actual transition and the end point

correlation line.

4095

4094

4093

456

4093 4094 4095 4096

(1)

(2)

(3)

VDDA

VSSA

VDDA

4096

1LSBIDEAL =

MS34980V1

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