FS32K112BHTXMLFTR datasheet(49/100 Pages) NXP

49 / 100 page

6. Quick Write times may take up to 550 µs, as additional cleanup may occur when crossing sector boundaries.

7. Time for emulated EEPROM record scheme overhead cleanup. Automatically done after last (Nth) write completes,

assuming still powered. Or via SETRAM cleanup execution command is requested at a later point.

NOTE

Under certain circumstances FlexMEM maximum times may be

exceeded. In this case the user or application may wait, or assert

reset to the FTFC/FTFM macro to stop the operation.

6.3.1.2 Reliability specifications

Table 38. NVM reliability specifications

Symbol

Description

Min.

Typ.

Max.

Unit

Notes

When using as Program and Data Flash

tnvmretp1k Data retention after up to 1 K cycles

—

years

nnvmcycp

Cycling endurance

1 K

—

cycles

2, 3

When using FlexMemory feature : FlexRAM as Emulated EEPROM

tnvmretee100 Data retention up to 100% of write endurance

—

years

1, 4

tnvmretee10 Data retention up to 10% of write endurance

—

years

nnvmwree16

nnvmwree256

Write endurance

• EEPROM backup to FlexRAM ratio = 16

• EEPROM backup to FlexRAM ratio = 256

100 K

1.6 M

—

writes

5, 6, 7

1. Data retention period per block begins upon initial user factory programming or after each subsequent erase.

2. Program and Erase for PFlash and DFlash are supported across product temperature specification in Normal Mode (not

supported in HSRUN mode).

3. Cycling endurance is per DFlash or PFlash Sector.

4. Background maintenance operations during normal FlexRAM usage extend effective data retention life beyond 5 years.

5. FlexMemory write endurance specified for 16-bit and/or 32-bit writes to FlexRAM and is supported across product

temperature specification in Normal Mode (not supported in HSRUN mode). Greater write endurance may be achieved

with larger ratios of EEPROM backup to FlexRAM.

6. For usage of any EEE driver other than the FlexMemory feature, the endurance spec will fall back to the specified

endurance value of the D-Flash specification (1K).

7. FlexMemory calculator tool is available at NXP web site for help in estimation of the maximum write endurance achievable

at specific EEPROM/FlexRAM ratios. The “In Spec” portions of the online calculator refer to the NVM reliability

specifications section of data sheet. This calculator is only applies to the FlexMemory feature.

6.3.2 QuadSPI AC specifications

The following table describes the QuadSPI electrical characteristics.

• Measurements are with maximum output load of 25 pF, input transition of 1 ns and

pad configured with fastest slew settings (DSE = 1'b1).

• I/O operating voltage ranges from 2.97 V to 3.6 V

• While doing the mode transition (RUN -> HSRUN or HSRUN -> RUN ), the

interface should be OFF.

• Add 50 ohm series termination on board in QuadSPI SCK for Flash A to avoid loop

back reflection when using in Internal DQS (PAD Loopback) mode.

Memory and memory interfaces

S32K1xx Data Sheet, Rev. 12, 02/2020

NXP Semiconductors

FS32K112BHTXMLFTR bảng dữ liệu(PDF) 49 Page - NXP Semiconductors

FS32K112BHTXMLFTR bảng dữ liệu(HTML) 49 Page - NXP Semiconductors

Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 71 72 73 74 75 76 77 78 79 80 81 82 83 84 85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 100

bảng dữ liệu tải về

Link URL