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STM32L100RB bảng dữ liệu(PDF) 87 Page - STMicroelectronics

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STM32L100RB bảng dữ liệu(HTML) 87 Page - STMicroelectronics

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STM32L100C6 STM32L100R8/RB
Electrical characteristics
90
dGain/dT(1)
Gain error temperature
coefficient
VDDA = 3.3V, TA = 0 to 50 ° C
DAC output buffer OFF
-10
-2
0
µV/°C
VDDA = 3.3V, TA = 0 to 50 ° C
DAC output buffer ON
-40
-8
0
TUE(1)
Total unadjusted error
CL ≤ 50 pF, RL ≥ 5 kΩ
DAC output buffer ON
-12
30
LSB
No RL, CL ≤ 50 pF
DAC output buffer OFF
-8
12
tSETTLING
Settling time (full scale: for a
12-bit code transition
between the lowest and the
highest input codes till
DAC_OUT reaches final
value ±1LSB
CL ≤ 50 pF, RL ≥ 5 kΩ
-7
12
µs
Update rate
Max frequency for a correct
DAC_OUT change (95% of
final value) with 1 LSB
variation in the input code
CL ≤ 50 pF, RL ≥ 5 kΩ
-
-
1
Msps
tWAKEUP
Wakeup time from off state
(setting the ENx bit in the
DAC Control register)(7)
CL ≤ 50 pF, RL ≥ 5 kΩ
-9
15
µs
PSRR+
VDDA supply rejection ratio
(static DC measurement)
CL ≤ 50 pF, RL ≥ 5 kΩ
-
-60
-35
dB
1. Guaranteed by characterization results.
2. Difference between two consecutive codes - 1 LSB.
3. Difference between measured value at Code i and the value at Code i on a line drawn between Code 0 and last Code
4095.
4. Difference between the value measured at Code (0x800) and the ideal value = VDDA/2.
5. Difference between the value measured at Code (0x001) and the ideal value.
6. Difference between ideal slope of the transfer function and measured slope computed from code 0x000 and 0xFFF when
buffer is OFF, and from code giving 0.2 V and (VDDA – 0.2) V when buffer is ON.
7. In buffered mode, the output can overshoot above the final value for low input code (starting from min value).
Table 56. DAC characteristics (continued)
Symbol
Parameter
Conditions
Min
Typ
Max
Unit



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