STM32L100RB datasheet(72/103 Pages) STMICROELECTRONICS

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Electrical characteristics

STM32L100C6 STM32L100R8/RB

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DocID024295 Rev 5

Output driving current

The GPIOs (general purpose input/outputs) can sink or source up to ±8 mA, and sink or

source up to ±20 mA (with the non-standard VOL/VOH specifications given in Table 42.

In the user application, the number of I/O pins which can drive current must be limited to

respect the absolute maximum rating specified in Section 6.2:

•

The sum of the currents sourced by all the I/Os on VDD, plus the maximum Run

consumption of the MCU sourced on VDD, cannot exceed the absolute maximum rating

ΣIVDD (see Table 10).

•

The sum of the currents sunk by all the I/Os on VSS plus the maximum Run

consumption of the MCU sunk on VSS cannot exceed the absolute maximum rating

ΣIVSS (see Table 10).

Output voltage levels

Unless otherwise specified, the parameters given in Table 42 are derived from tests

performed under ambient temperature and VDD supply voltage conditions summarized in

Table 12. All I/Os are CMOS and TTL compliant.

Table 42. Output voltage characteristics

Symbol

Parameter

Conditions

Min

Max

Unit

VOL(1)(2)

Output low level voltage for an I/O pin

IIO = 8 mA

2.7 V < VDD < 3.6 V

-0.4

VOH(3)(2)

Output high level voltage for an I/O pin

VDD-0.4

VOL (1)(4) Output low level voltage for an I/O pin

IIO = 4 mA

1.8 V < VDD < 2.7 V

-0.45

VOH (3)(4) Output high level voltage for an I/O pin

VDD-0.45

VOL(1)(4)

Output low level voltage for an I/O pin

IIO = 20 mA

2.7 V < VDD < 3.6 V

-1.3

VOH(3)(4) Output high level voltage for an I/O pin

VDD-1.3

1. The IIO current sunk by the device must always respect the absolute maximum rating specified in Table 10 and the sum of

IIO (I/O ports and control pins) must not exceed IVSS.

2. Guaranteed by test in production.

3. The IIO current sourced by the device must always respect the absolute maximum rating specified in Table 10 and the sum

of IIO (I/O ports and control pins) must not exceed IVDD.

4. Guaranteed by characterization results.

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