VSC7212RG datasheet(27/34 Pages) VITESSE

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VITESSE

SEMICONDUCTOR CORPORATION

VITESSE

SEMICONDUCTOR CORPORATION

Preliminary Data Sheet

VSC7212

Gigabit Interconnect Chip

G52268-0, Rev 3.3

Page 27

04/10/01

Tel: (800)-VITESSE • FAX: (805) 987-5896 • Email: prodinfo@vitesse.com

Internet: www.vitesse.com

Absolute Maximum Ratings (1)

Power Supply Voltage (any VDDX) .................................................................................................. 0.5V to +3.8V

PECL Differential Input Voltage ............................................................................................ -0.5V to VDD +0.5V

TTL Input Voltage ............................................................................................................................. -0.5V to 5.5V

TTL Output Voltage .............................................................................................................. -0.5V to VDD + 0.5V

TTL Output Current ...................................................................................................................................... 50mA

PECL Output Current .................................................................................................................................... 50mA

Case Temperature Under Bias (TC).............................................................................................. -55

oC to +125oC

Storage Temperature (TSTG)......................................................................................................... -65

oC to +150oC

Recommended Operating Conditions

Power Supply Voltage, (VDD) ................................................................................................................+3.3V+5%

Operating Temperature Range .................................................................................0oC Ambient to +100oC Case

NOTE: (1) CAUTION: Stresses listed under “Absolute Maximum Ratings” may be applied to devices one at a time without caus-

ing permanent damage. Functionality at or above the values listed is not implied. Exposure to these values for extended

periods may affect device reliability.

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