STM32F446MC datasheet(39/201 Pages) STMICROELECTRONICS

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STM32F446xC/E

Functional overview

Additional logic functions embedded in the ADC interface allow:

•

Simultaneous sample and hold

•

Interleaved sample and hold

The ADC can be served by the DMA controller. An analog watchdog feature allows very

precise monitoring of the converted voltage of one, some or all selected channels. An

interrupt is generated when the converted voltage is outside the programmed thresholds.

To synchronize A/D conversion and timers, the ADCs could be triggered by any of TIM1,

TIM2, TIM3, TIM4, TIM5, or TIM8 timer.

3.38

Temperature sensor

The temperature sensor has to generate a voltage that varies linearly with temperature. The

conversion range is between 1.7 V and 3.6 V. The temperature sensor is internally

connected to the same input channel as VBAT, ADC1_IN18, which is used to convert the

sensor output voltage into a digital value. When the temperature sensor and VBAT

conversion are enabled at the same time, only VBAT conversion is performed.

As the offset of the temperature sensor varies from chip to chip due to process variation, the

internal temperature sensor is mainly suitable for applications that detect temperature

changes instead of absolute temperatures. If an accurate temperature reading is needed,

then an external temperature sensor part should be used.

3.39

Digital-to-analog converter (DAC)

The two 12-bit buffered DAC channels can be used to convert two digital signals into two

analog voltage signal outputs.

This dual digital Interface supports the following features:

•

two DAC converters: one for each output channel

•

8-bit or 10-bit monotonic output

•

left or right data alignment in 12-bit mode

•

synchronized update capability

•

noise-wave generation

•

triangular-wave generation

•

dual DAC channel independent or simultaneous conversions

•

DMA capability for each channel

•

external triggers for conversion

•

input voltage reference VREF+

Eight DAC trigger inputs are used in the device. The DAC channels are triggered through

the timer update outputs that are also connected to different DMA streams.

3.40

Serial wire JTAG debug port (SWJ-DP)

The ARM SWJ-DP interface is embedded, and is a combined JTAG and serial wire debug

port that enables either a serial wire debug or a JTAG probe to be connected to the target.

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