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MFRC522 bảng dữ liệu(PDF) 81 Page - NXP Semiconductors

tên linh kiện MFRC522
Giải thích chi tiết về linh kiện  Contactless reader IC
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MFRC522 bảng dữ liệu(HTML) 81 Page - NXP Semiconductors

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MFRC522_33
© NXP B.V. 2009. All rights reserved.
Product data sheet
PUBLIC
Rev. 3 — 26 October 2009
112133
81 of 96
NXP Semiconductors
MFRC522
Contactless reader IC
16.1.3.1
Example: Output test signals TestDAC1 and TestDAC2
The AnalogTestReg register is set to 11h. The output on pin AUX1 has the test signal
TestDAC1 and the output on pin AUX2 has the test signal TestDAC2. The signal values of
TestDAC1 and TestDAC2 are controlled by the TestDAC1Reg and TestDAC2Reg registers.
Figure 28 shows test signal TestDAC1 on pin AUX1 and TestDAC2 on pin AUX2 when the
TestDAC1Reg register is programmed with a slope defined by values 00h to 3Fh and the
TestDAC2Reg register is programmed with a rectangular signal defined by values 00h and
3Fh.
16.1.3.2
Example: Output test signals Corr1 and MinLevel
Figure 29 shows test signals Corr1 and MinLevel on pins AUX1 and AUX2, respectively.
The AnalogTestReg register is set to 24h.
1101
RxActive
1110
subcarrier detected
1111
TstBusBit
Table 158. Test signal descriptions …continued
AnalogSelAux1[3:0]
or
AnalogSelAux2[3:0]
value
Signal on pin AUX1 or pin AUX2
(1) TestDAC1 (500 mV/div) on pin AUX1.
(2) TestDAC2 (500 mV/div) on pin AUX2.
Fig 28. Output test signals TestDAC1 on pin AUX1 and TestDAC2 on pin AUX2
100 ms/div
001aak597
(1)
(2)



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