MFRC522 datasheet(60/96 Pages) NXP

60 / 96 page

MFRC522_33

Product data sheet

PUBLIC

Rev. 3 — 26 October 2009

112133

60 of 96

NXP Semiconductors

MFRC522

Contactless reader IC

9.3.4 Page 3: Test

9.3.4.1

Reserved register 30h

Functionality is reserved for future use.

9.3.4.2

TestSel1Reg register

General test signal conﬁguration.

9.3.4.3

TestSel2Reg register

General test signal conﬁguration and PRBS control.

Table 116. TCounterValReg register lower bit descriptions

Bit

Symbol

Description

7 to 0

TCounterVal_Lo

[7:0]

timer value lower 8 bits

Table 117. Reserved register (address 30h); reset value: 00h bit allocation

Bit

Symbol

reserved

Access

Table 118. Reserved register bit descriptions

Bit

Symbol

Description

7 to 0

reserved

reserved for future use

Table 119. TestSel1Reg register (address 31h); reset value: 00h bit allocation

Bit

Symbol

reserved

TstBusBitSel[2:0]

Access

R/W

Table 120. TestSel1Reg register bit descriptions

Bit

Symbol

Description

7 to 3

reserved

reserved for future use

2 to 0

TstBusBitSel

[2:0]

selects a test bus signal which is output at pin MFOUT

if AnalogSelAux2[3:0] = FFh in AnalogTestReg register, test bus signal

is also output at pins AUX1 or AUX2

Table 121. TestSel2Reg register (address 32h); reset value: 00h bit allocation

Bit

Symbol

TstBusFlip

PRBS9

PRBS15

TestBusSel[4:0]

Access

R/W

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