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MFRC522 bảng dữ liệu(PDF) 76 Page - NXP Semiconductors

tên linh kiện MFRC522
Giải thích chi tiết về linh kiện  Contactless Reader IC
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MFRC522 bảng dữ liệu(HTML) 76 Page - NXP Semiconductors

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© NXP B.V. 2007. All rights reserved.
Product data sheet
Rev. 3.2 — 22 May 2007
76 of 109
NXP Semiconductors
MFRC522
Contactless Reader IC
19. Testsignals
19.1 Selftest
The MFRC522 has the capability to perform a digital selftest. To start the selftest the
following procedure has to be performed:
1. Perform a soft reset.
2. Clear the internal buffer by writing 25 bytes of 00h and perform the Config Command.
3. Enable the Selftest by writing the value 09h to the register AutoTestReg.
4. Write 00h to the FIFO.
5. Start the Selftest with the CalcCRC Command.
6. The Selftest will be performed.
7. When the Selftest is finished, the FIFO contains the following bytes:
Correct answer for register VersionReg equal to 90h:
00h, 87h, 98h, 0fh, 49h, FFh, 07h, 19h
BFh, 22h, 30h, 49h, 59h, 63h, ADh, CAh
7Fh, E3h, 4Eh, 03h, 5Ch, 4Eh, 49h, 50h
47h, 9Ah, 37h, 61h, E7h, E 2h, C6h, 2Eh
75h, 5Ah, EDh, 04h, 3Dh, 02h, 4Bh, 78h
32h, FFh, 58h, 3Bh, 7Ch, E9h, 00h, 94h
B4h, 4Ah, 59h, 5Bh, FDh, U9h, 29h, DFh
35h, 96h, 98h, 9Eh, 4Fh, 30h, 32h, 8Dh
Correct answer for register VersionReg equal to 91h:
00h, C6h, 37h, D5h, 32h, B7h, 57h, 5Ch,
C2h, D8h, 7Ch, 4Dh, D9h, 70h, C7h, 73h,
10h, E6h, D2h, AAh, 5Eh, A1h, 3Eh, 5Ah,
14h, AFh, 30h, 61h, C9h, 70h, DBh, 2Eh,
64h, 22h, 72h, B5h, BDh, 65h, F4h, ECh,
22h, BCh, D3h, 72h, 35h, CDh, AAh, 41h,
1Fh, A7h, F3h, 53h, 14h, DEh, 7Eh, 02h,
D9h, 0Fh, B5h, 5Eh, 25h, 1Dh, 29h, 79h
19.2 Test bus
The test bus is implemented for production test purposes. The following configuration can
be used to improve the design of a system using the MFRC522. The test bus allows to
route internal signals to the digital interface. The test bus signals are selected by
accessing TestBusSel in register TestSel2Reg.
Table 150: TestSel2Reg register (address 07h)
Pins
D6
D5
D4
D3
D2
D1
Testsignal
sdata
scoll
svalid
sover
RCV_reset
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