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ADUM1253 bảng dữ liệu(PDF) 21 Page - Analog Devices |
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ADUM1253 bảng dữ liệu(HTML) 21 Page - Analog Devices |
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21 / 24 page ![]() ADuM1253 Ultra-Low-Power, I2C Isolator with Unidirectional SCL, Extended VDD, Idle-Bus Hot-Swap, and Low VOL www.analog.com Analog Devices | 21 125µs FILTER STOP DETECT SDA SCL IDLE STOP 200ns GLITCH FILTER 200ns GLITCH FILTER SIDE1 HIGH SIGNAL S R Q SIDE 1 OFF RST CON PRECHARGE SDA2 CON SCL2 CON 0.45VDD2 RST SDA2/SCL2 SIDE 1 BUS STUCK 0.38VDD2 VDD2 0.45VDD2 1/3 VDD2 PRECHARGE 1/3 VDD2 Figure 7. Bus Connection Logic Bus Connection The ADuM1253 connects the side 1 bus to the side 2 bus when both busses are idle or when side 1 is high and an I2C stop condition has been detected on side 2. If a stuck bus condition is detected on side 1, then the ADuM1253 disconnects the two busses to allow the external system to attempt a recovery. Applications Information Power-Supply Sequencing The ADuM1253 does not require special power-supply sequencing. The logic levels are set independently on either side by VDD1 and VDD2. Each supply can be present over the entire specified range regardless of the level or presence of the other supply. Power-Supply Decoupling To reduce ripple and the chance of introducing data errors especially if large common-mode transients are expected in the application, bypass VDD1 and VDD2 with 100nF and 1nF low-ESR ceramic capacitors to GND1 and GND2, respectively. Place the bypass capacitors as close to the power-supply input pins as possible. Thermal Considerations Thermal performance is directly linked to printed circuit board (PCB) design and operating environment. Pay careful attention to the PCB thermal design. Thermal parameter values are specified in the Package Information section. θJA and θJB are mainly used to compare the thermal performance of the package of the device with other semiconductor packages when all test conditions listed are similar. ΨJB r ΨJT can be used to estimate the junction temperature when an accurate thermal measurement of the board temperature is available. The temperature measurement must be near the device under test (DUT) or directly on the package top surface, operating in the system environment. θJA can be used for a first-order approximation to calculate the junction temperature in the system environment. The power dissipation (PD), junction-to-ambient thermal impedance (θJA), and ambient temperature (TA) determine the junction temperature (TJ) according to the expression: TJ = TA + (PD x ������JA) |
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