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VSC8541XMV-05 bảng dữ liệu(PDF) 87 Page - Microchip Technology

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Electrical Specifications
VMDS-10513 VSC8541-02 Datasheet Revision 4.1
78
1. Minimum specification is ambient temperature, and the maximum is junction temperature.
5.4
Stress Ratings
This section contains the stress ratings for the VSC8541-02 device.
Warning Stresses listed in the following table may be applied to devices one at a time without causing
permanent damage. Functionality at or exceeding the values listed is not implied. Exposure to these
values for extended periods may affect device reliability.
Warning This device can be damaged by electrostatic discharge (ESD) voltage. Microsemi
recommends that all integrated circuits be handled with appropriate precautions. Failure to observe
proper handling and installation procedures may adversely affect reliability of the device.
Table 116 •
Stress Ratings
Parameter
Symbol
Minimum
Maximum
Unit
Power supply voltage for core supply
VDD1
–0.3
1.10
V
Power supply voltage for analog circuits
VDD1A
–0.3
1.10
V
Power supply voltage for analog circuits
VDD25A
–0.3
2.75
V
Power supply voltage for digital I/O
VDDMAC,
VDDIO,
VDDMDIO
–0.3
3.6
V
Input voltage for digital I/O (3.3 V)
3.6
V
Input voltage for digital I/O (2.5 V)
3.3
V
Storage temperature
TS
–55
125
°C
Electrostatic discharge voltage, charged device model
VESD_CDM –1000
1000
V
Electrostatic discharge voltage, human body model
VESD_HBM
See note1
1.
This device has completed all required testing as specified in the JEDEC standard JESD22-A114, Electrostatic
Discharge (ESD) Sensitivity Testing Human Body Model (HBM)
, and complies with a Class 2 rating. The
definition of Class 2 is any part that passes an ESD pulse of 2000 V, but fails an ESD pulse of 4000 V.
V



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