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ISM303DAC bảng dữ liệu(PDF) 14 Page - STMicroelectronics |
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ISM303DAC bảng dữ liệu(HTML) 14 Page - STMicroelectronics |
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14 / 80 page ![]() Module specifications ISM303DAC 14/80 DocID030988 Rev 2 M_R Magnetic RMS noise(13) High-performance mode 3 5 mgauss (RMS) ST Self-test positive difference(14) (accelerometer only) 70 1500 mg M_ST Magnetic self-test(15) 15 500 mgauss Top Operating temperature range -40 +85 °C 1. Min/Max values are based on characterization results, not tested in production and not guaranteed. 2. Typical specifications are not guaranteed. 3. The typical value of the magnetic dynamic range applies when the magnetic field is fully aligned with one of the sensitive axes. In presence of a stray field in the cross-axis direction, the magnetic dynamic range (max module) can decrease down to the min value. 4. Sensitivity calculated at 16-bit. 5. Values after calibration test and trimming. 6. Measurements are performed in a uniform temperature setup and they are based on characterization data in a limited number of samples, not measured during final test for production. 7. Typical zero-g level offset value after calibration and trimming. 8. Offset can be eliminated by enabling the slope filter. 9. Based on characterization data on a limited number of samples, not measured during final test for production. 10. Excluding drift due to magnetic shock. 11. Noise density is the same for all ODR. 12. RMS noise is the same for all ODR. 13. With low-pass filter or offset cancellation enabled. 14. “Self-test positive difference” is defined as: OUTPUT[mg](CTRL3 ST2, ST1 bits=01) - OUTPUT[mg](CTRL3 ST2, ST1 bits=00). 15. Magnetic “self-test” is defined as OUTPUT[gauss](self-test enabled) - OUTPUT[gauss](self-test disabled). Table 3. Sensor characteristics (continued) Symbol Parameter Test conditions Min.(1) Typ.(2) Max.(1) Unit |
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