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ISM303DAC bảng dữ liệu(PDF) 14 Page - STMicroelectronics

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Giải thích chi tiết về linh kiện  High-performance, low-power, compact 3D accelerometer and 3D magnetometer module
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nhà sản xuất  STMICROELECTRONICS [STMicroelectronics]
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Module specifications
ISM303DAC
14/80
DocID030988 Rev 2
M_R
Magnetic RMS noise(13)
High-performance mode
3
5
mgauss
(RMS)
ST
Self-test positive difference(14)
(accelerometer only)
70
1500
mg
M_ST
Magnetic self-test(15)
15
500
mgauss
Top
Operating temperature range
-40
+85
°C
1. Min/Max values are based on characterization results, not tested in production and not guaranteed.
2. Typical specifications are not guaranteed.
3. The typical value of the magnetic dynamic range applies when the magnetic field is fully aligned with one of the sensitive
axes. In presence of a stray field in the cross-axis direction, the magnetic dynamic range (max module) can decrease down
to the min value.
4. Sensitivity calculated at 16-bit.
5. Values after calibration test and trimming.
6. Measurements are performed in a uniform temperature setup and they are based on characterization data in a limited
number of samples, not measured during final test for production.
7. Typical zero-g level offset value after calibration and trimming.
8. Offset can be eliminated by enabling the slope filter.
9. Based on characterization data on a limited number of samples, not measured during final test for production.
10. Excluding drift due to magnetic shock.
11. Noise density is the same for all ODR.
12. RMS noise is the same for all ODR.
13. With low-pass filter or offset cancellation enabled.
14. “Self-test positive difference” is defined as: OUTPUT[mg](CTRL3 ST2, ST1 bits=01) - OUTPUT[mg](CTRL3 ST2, ST1 bits=00).
15. Magnetic “self-test” is defined as OUTPUT[gauss](self-test enabled) - OUTPUT[gauss](self-test disabled).
Table 3. Sensor characteristics (continued)
Symbol
Parameter
Test conditions
Min.(1)
Typ.(2)
Max.(1)
Unit



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