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SCANPSC110F bảng dữ liệu(PDF) 19 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
tên linh kiện SCANPSC110F
Giải thích chi tiết về linh kiện  SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support)
PDF  29 Pages
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nhà sản xuất  NSC [National Semiconductor (TI)]
Trang chủ  http://www.national.com
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SCANPSC110F bảng dữ liệu(HTML) 19 Page - National Semiconductor (TI)

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DC Electrical Characteristics (Continued)
Symbol
Parameter
V
CC
(V)
Military
Units
Conditions
T
A =
−55˚C to +125˚C
Guaranteed
Limits
I
IN (OE,
Maximum Input
5.5
±1.0
µA
V
IN = VCC or
TCK
B,S(0–5))
Leakage Current
V
IN = GND
I
IN, MAX
Maximum Input
V
IN = VCC
(TRST, TDI
Ln,
Leakage Current
5.5
3.7
µA
TDI
B, TMSB)
I
IN, MAX
Maximum Input
V
IN = GND
(TRST, TDI
Ln,
Leakage Current
5.5
−385
µA
TDI
B, TMSB)
I
IN, MIN
Minimum Input
V
IN = GND
(TDI
B, TMSB,
Leakage Current
5.5
−160
µA
TRST, TDI
Ln)
I
CCT
Maximum
I
CC/Input
5.5
1.6
mA
V
IN = VCC −2.1V
I
CCT
Maximum
V
IN = VCC −2.1V
(TDI
B, TMSB,ICC/Input
5.5
1.75
mA
Test one at a time
TRST, TDI
L)
with others floating
I
CC
Maximum
Quiescent
5.5
168
µA
TDI
B, TMSB, TRST,
Supply Current
TDI
L = VCC
I
CC, MAX
Maximum
Quiescent
5.5
2.5
mA
TDI
B, TMSB, TRST,
Supply Current
TDI
L = GND
I
OLD
Minimum
V
OLD = 1.65V max
(TCK
Ln, TMSLn,
Dynamic
5.5
50
mA
V
IN (OE) = VIL
TDO
Ln)
Output Current
(Note 6)
I
OLD
Minimum
V
OLD = 0.8V
(TDO
B)
Dynamic
5.5
63
mA
V
IN (TRST) = VIH
Output Current
(Note 6)
I
OHD
Minimum
V
OHD = 3.85V max
(TCK
Ln, TMSLn,
Dynamic
5.5
−50
mA
(Note 6)
TDO
Ln)
Output Current
I
OHD
Minimum Dynamic
V
OHD = 2.0V max
(TDO
B)
Output Current
5.5
−27
mA
(Note 6)
I
OZ
Maximum
V
IN (OE) = VIH
TRI-STATE®
5.5
±10.0
µA
V
IN (TRST) = VIL
Leakage Current
V
O = VCC, GND
I
OS
Output Short
5.5
−100
mA
V
O = 0.0V
(TDO
B)
Circuit Current
min
(Note 7)
Note 6: Maximum test duration of 2 ms. One output loaded at a time.
Note 7: Maximum test duration not to exceed 1 second.
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