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SCANPSC110F bảng dữ liệu(PDF) 9 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
tên linh kiện SCANPSC110F
Giải thích chi tiết về linh kiện  SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support)
PDF  29 Pages
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nhà sản xuất  NSC [National Semiconductor (TI)]
Trang chủ  http://www.national.com
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SCANPSC110F bảng dữ liệu(HTML) 9 Page - National Semiconductor (TI)

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Hierarchical Test Support
Multiple SCANPSC110F Bridges can be used to assemble a
hierarchical boundary-scan tree. In such a configuration, the
system tester can configure the local ports of a set of
’PSC110Fs so as to connect a specific set of local
scan-chains to the active scan chain. Using this capability,
the tester can selectively communicate with specific portions
of a target system.
The tester’s scan port is connected to the backplane scan
port of a “root” layer of ’PSC110Fs, each of which can be se-
lected using multi-drop addressing. A second tier of
’PSC110Fs can be connected to this root layer, by connect-
ing a local port (LSP) of a root-layer ’PSC110F to the back-
plane port of a second-tier ’PSC110F. This process can be
continued to construct a multi-level scan hierarchy.
’PSC110F
local
ports
which
are
not
cascaded
into
higher-level ’PSC110Fs can be thought of as the terminal
“leaves” of a scan “tree”. The test master can select one or
more target leaves by selecting and configuring the local
ports of an appropriate set of ’PSC110Fs in the test tree.
Level 1 Protocol
ADDRESSING MODES
The SCANPSC110F Bridge supports “single” and “multiple”
modes of addressing a ’PSC110F. The “single” mode will se-
lect one ’PSC110F and is called Direct Addressing. More
than one ’PSC110F device can be selected via the Broad-
cast and Multi-Cast Addressing modes.
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