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BQ76PL455APFCT bảng dữ liệu(PDF) 10 Page - Texas Instruments

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bq76PL455A
SLUSCL0A – SEPTEMBER 2016 – REVISED OCTOBER 2016
www.ti.com
Product Folder Links: bq76PL455A
Submit Documentation Feedback
Copyright © 2016, Texas Instruments Incorporated
6.11 ADC: VSENSEn Cell Measurement Inputs
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VCELL_VR
Input voltage range
VCELL= VSENSEn – VSENSEn–1, n= 1
to 16
1
4.95
V
VCHERR25NB
Total Channel Measurement Accuracy at 25°C
VSENSE = 3.6 V
±0.75
mV
VCHERR
Total Channel Measurment Accuracy,
temperature range of 0°C to 65°C
(1)(2)
VSENSE = 1.5 V
–1.50
1.50
mV
VSENSE = 2.0 V
–2.00
2.00
VSENSE = 3.3 V
–3.25
3.25
VSENSE = 3.6 V
–3.50
3.50
VSENSE = 4.2 V
–3.90
3.90
VSENSE = 4.5 V
–4.00
4.00
VCHERR
Total Channel Measurment Accuracy,
temperature range of –40°C to 85°C
(1)(2)
VSENSE = 1.5 V
–2.85
2.85
mV
VSENSE = 2.0 V
–3.00
3.00
VSENSE = 3.3 V
–4.75
4.75
VSENSE = 3.6 V
–5.00
5.00
VSENSE = 4.2 V
–5.50
5.50
VSENSE = 4.5 V
–5.75
5.75
ISENSE_SEL
(3)(4)
VSENSEn input current n = 1 to 16
VSENSEn–1 pin; on selected channel
2
7.6
µA
ISENSE_NSEL
Channel not selected
< ±100
nA
ISENSE_SD
VSENSEn input current in
SHUTDOWN Mode
< ±100
nA
RSENSE_SEL
(4)
VSENSE input resistance
Channel selected for conversion,
measured differentially
[VSENSEn–VSENSE(n–1)]
1
MΩ
OWDSR
Open-wire detection shunt resistance
Open-wire test mode, TSTCONFIG[4]
= 1
all odd (CBENBL = 0xAA); or all even
(CBENBL=0x55) cell squeeze resistors
on (alternate resistors only)
4
kΩ
LT_DriftVCHAN
Long-term drift (total channel path)
VSENSE = 4.5 V, TA = 65°C
(5)
18.47
ppm/ 1000
hours
VSENSE = 4.5 V, TA = 105°C
(6)
50.24
VADC_REF_25
ADC reference
2.5
V
ERRADC_REF_25
ADC reference error
0°C
≤ TA ≤ 65°C
–2.5
2.5
mV
–40°C
≤ TA ≤ 85°C
–3.5
3.5
mV
(1) Error measured with averaging enabled.
(2) User adjustable Gain and Offset registers are provided for further error trim at VSGAIN and VSOFFSET, respectively.
(3) When the bq76PL455A is in IDLE power mode, but not converting any ADC input channel, the part idles the multiplexer on the highest
channel enabled for conversions in the CHAN register.
(4) The current into VSENSEn = ISENSE_SEL + VCELL/RSENSE_SEL.
(5) Computed from the first 500-hour operating life test at a stress temperature of 65°C.
(6) Computed from the first 500-hour operating life test at a stress temperature of 105°C.
6.12 ADC: VMODULE Input
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VMODULE_VR
Input voltage range
Measured from TOP to GND (AGND1)
VTOP MIN
VTOP MAX
V
VMODULE_ERR85
Total error from all internal sources
TA = –40°C to 85°C
–450
±100
450
mV
(1)
Specified by design, not tested in production.
(2)
Calculated and statistically projected worst case from characterization data. Not tested in production.
6.13 ADC: AUXn General Purpose Inputs
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
VAUX_VR
Input voltage range(1)
VP/VDIG = 5.3 V
0
5
V
VAUXERR65
Total AUX Channel Measurement
Accuracy(2)
VAUX = 0.05 V, 0°C
≤ TA ≤ 65°C
–3
0.1
3
mV
VAUX = 4.95 V, 0°C
≤ TA ≤ 65°C
–10
0.1
10
mV
VAUXERR85
Total AUX Channel Measurement
Accuracy(2)
VAUX = 0.05 V, –40°C
≤ TA ≤ 85°C
–4.5
0.1
4.5
mV
VAUX = 4.95 V, –40°C
≤ TA ≤ 85°C
–12.5
0.1
12.5
mV



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