LM93 datasheet(33/92 Pages) NSC

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15.0 Using The LM93 (Continued)

15.11 XOR TREE TEST

An XOR tree is provided in the LM93 for Automated Test

Equipment (ATE) board level connectivity testing. This al-

lows the functionality of all digital inputs to be tested in a

simple manner and any pins that are non-functional or

shorted together to be identified. When the test mode is

enabled by setting the ‘XEN’ bit in the XOR Test register, the

part enters XOR test mode.

The following signals are included in the XOR test tree:

Px_VIDy

GPIO_x

PWMx

Px_PROCHOT

VRDx_HOT

SCSI_TERMx

RESET

Since the test mode is XOR tree, the order of the signals in

the tree is not important. SMBDAT and SMBCLK should not

be included in the test tree.

Example of XOR Test Tree (not showing all signals)

20068219

To properly implement the XOR TREE test on the PCB, no

pins listed in the tree should be connected directly to power

or ground. If a pin needs to be configured as a permanent

low, such as an address, it should be connected to ground

through a low value resister such as 10 k

Ω, to allow the ATE

(Automatic Test Equipment) to drive it high.

When generating test waveforms, a typical propagation de-

lay of 500 ns through the XOR tree should be allowed for.

LM93 bảng dữ liệu(PDF) 33 Page - National Semiconductor (TI)