ZL6105

33

FN6906.5

December 19, 2013

Revision History

The revision history provided is for informational purposes only and is believed to be accurate, but not warranted. Please go to web to make sure you

have the latest Rev.

DATE

REVISION

CHANGE

December 19, 2013

July 30, 2013

ISENA pin. The voltage rating changed from: -1.5V to 6.5V, to: -1.5V to 30V.

Changed the 6.5V to 30V on page 7 Absolute Maximum Ratings

October 15, 2012

FN6906.4 Changed POD from L36.6x6A to L36.6x6C - change in side view MAX from 0.90 to 1.00

October 1, 2012

Removed all references to ZL6105-01, page 5, Ordering Information

December 15, 2010

FN6906.3 In “Voltage Margining” on page 25, in the 2nd paragraph, changed the last sentence from "A safety feature prevents

the user from configuring the output voltage to exceed VNOM + 10% under any conditions." to "The ZL6105-01 allows

150% margin limits."

Added following parts to “Ordering Information” on page 6:

ZL6105ALAF-01

ZL6105ALAFT-01

ZL6105ALAFTK-01

Updated note in MIN, MAX column of spec table from "Parameters with MIN and/or MAX limits are 100% tested

at +25°C, unless otherwise specified. Temperature limits established by characterization and are not production

tested." to "Compliance to datasheet limits is assured by one or more methods: production test, characterization

and/or design."

Removed note "Limits established by characterization and are not production tested." and all references to it.

December 8, 2010

FN6906.2 Added following statement to disclaimer on page 34: “This product is subject to a license from Power One, Inc.

related to digital power technology as set forth in U.S. Patent No. 7,000,125 and other related patents owned by

Power One, Inc. These license rights do not extend to stand-alone POL regulators unless a royalty is paid to Power

One, Inc.”

September 20, 2010

FN6906.1 -Added a second sentence ("A minimum droop resistance of 0.5mΩ is recommended.") to “Active Current

Sharing” on page 28

-On page 21, in Equation 31, changed "

δ" to "Δ".

-Added “Limits established by characterization and are not production tested.” to “Soft-start Delay Duration

Range” on page 8, “Soft-start Ramp Duration Range” on page 8 and “VTRK Regulation Accuracy” on page 8.

-Removed PG and SALRT from Conditions column of “Logic Input Leakage Current” on page 8.

September 14, 2010

-Added Table 8 “MINIMUM TON DELAY vs OPERATING MODE”

-Added the following paragraph to page 14:

"The ZL6105 has a minimum TON_DELAY requirement ... See Application Note AN2033 for details."

-Changed LOW delay time from "2" to "5" in Table 6 on page 14

-Removed first three rows (10, 11, and 12.1 rows) from Table 7 on page 14

-Rewrote paragraph directly above Figure 13 on page 21 (“When auto compensation is enabled ... as described

in “Soft-Start Delay and Ramp Times” on page 14")

-Changed min “Soft-start Delay Duration Range” on page 8 from 2 to 5 and 0.002 to 0.005

-Reworded Note 15 on page 9

-Changed Step 5 Description in Table 5 on page 14

-Replaced Step 5 Time Duration entry in Table 5 on page 14 with a dash (“-”)

-Rewrote paragraph on page 13 (“Once this process is completed...to ramp its output”)

-Replaced Table 16 “FC0 PIN-STRAP SETTINGS” on page 21

-Replaced Table 17 “FC1 PIN-STRAP SETTINGS” on page 22

-Rewrote the last three paragraphs of “Loop Compensation” on page 21

-Added third paragraph to “Power-Good” on page 15 (“If Auto Comp is enabled, the PG timing is further controlled

by the PG Assert parameter as described “Loop Compensation” on page 21.”)

-Added sentence to Note 17 on page 9 ("Refer to “Soft-Start Delay and Ramp Times” on page 14 for further

restrictions on PG Delay.")

-In“Soft-start Delay Duration Accuracy” on page 8, in the Conditions, changed both references to Note 16 to be

Note 15. Removed Note 16.

-Rewrote first paragraph of “Configuration B: SYNC INPUT” on page 15

-Rewrote first three paragraphs of “Configuration C: SYNC AUTO DETECT” on page 15

-Added sentence just before Table 23 on page 26 (“Note that the SMBus address 0x4B is reserved for device test

and cannot be used in the system.”)