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AN3307 bảng dữ liệu(PDF) 34 Page - STMicroelectronics |
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AN3307 bảng dữ liệu(HTML) 34 Page - STMicroelectronics |
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34 / 37 page ![]() Class B solution structure AN3307 34/37 Doc ID 18186 Rev 4 5.4.7 Partial RAM runtime self-test The partial transparent RAM test is performed inside the timebase interrupt service routine. The test covers the part of the RAM allocated to class B variables. One block of six bytes is tested in each step of the test. To guarantee coupling fault coverage, the blocks of memory are overlapped by two side bytes from one test step to the other. The order of testing the bytes in the block is scrambled with respect to the physical order of addresses in memory. For more details see Section 5.2.4: Full RAM March C-/X self-test. Figure 20. Partial RAM runtime self-test structure In the first phase, the content of the block is stored in the storage buffer. Marching destructive tests are performed over all the bytes of the tested RAM block in the next phase. Then, in the final phase of this step, the original content is restored from the storage buffer. The March X algorithm is faster because two middle marching steps are skipped. As a last step of the test sequence, the storage buffer itself is tested by a marching test. The buffer is tested together with the next two additional bytes to cover coupling faults in the buffer itself. Then the whole test is reinitialized and it starts from the beginning. If any fault is detected, the Fail Safe routine is called. RAM_pointer = End of Class B RAM? Save content of RAM block into the Buffer Apply March test to the RAM block Restore content of RAM block from the Buffer RAM_pointer += block_size Test On going Apply March test to the Buffer FailSa fe () routine Test OK RAM_pointer = Start of Class B RAM Yes No Fail Fail AI18017 |
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