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AN3307 bảng dữ liệu(PDF) 34 Page - STMicroelectronics

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Giải thích chi tiết về linh kiện  Guidelines for obtaining IEC 60335 Class B certification for any STM32 application
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AN3307 bảng dữ liệu(HTML) 34 Page - STMicroelectronics

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Class B solution structure
AN3307
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Doc ID 18186 Rev 4
5.4.7
Partial RAM runtime self-test
The partial transparent RAM test is performed inside the timebase interrupt service routine.
The test covers the part of the RAM allocated to class B variables. One block of six bytes is
tested in each step of the test. To guarantee coupling fault coverage, the blocks of memory
are overlapped by two side bytes from one test step to the other. The order of testing the
bytes in the block is scrambled with respect to the physical order of addresses in memory.
For more details see Section 5.2.4: Full RAM March C-/X self-test.
Figure 20.
Partial RAM runtime self-test structure
In the first phase, the content of the block is stored in the storage buffer. Marching
destructive tests are performed over all the bytes of the tested RAM block in the next phase.
Then, in the final phase of this step, the original content is restored from the storage buffer.
The March X algorithm is faster because two middle marching steps are skipped. As a last
step of the test sequence, the storage buffer itself is tested by a marching test. The buffer is
tested together with the next two additional bytes to cover coupling faults in the buffer itself.
Then the whole test is reinitialized and it starts from the beginning. If any fault is detected,
the Fail Safe routine is called.
RAM_pointer = End
of Class B RAM?
Save content of RAM
block into the Buffer
Apply March test to the
RAM block
Restore content of RAM
block from the Buffer
RAM_pointer += block_size
Test On going
Apply March test
to the Buffer
FailSa fe () routine
Test OK
RAM_pointer = Start
of Class B RAM
Yes
No
Fail
Fail
AI18017



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