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AFS090 bảng dữ liệu(PDF) 192 Page - Microsemi Corporation |
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AFS090 bảng dữ liệu(HTML) 192 Page - Microsemi Corporation |
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192 / 334 page ![]() Device Architecture 2- 17 6 R e v isio n 2 Table 2-99 • Short Current Event Duration before Failure Temperature Time before Failure –40°C >20 years 0°C >20 years 25°C >20 years 70°C 5 years 85°C 2 years 100°C 6 months Table 2-100 • Schmitt Trigger Input Hysteresis Hysteresis Voltage Value (typ.) for Schmitt Mode Input Buffers Input Buffer Configuration Hysteresis Value (typ.) 3.3 V LVTTL/LVCMOS/PCI/PCI-X (Schmitt trigger mode) 240 mV 2.5 V LVCMOS (Schmitt trigger mode) 140 mV 1.8 V LVCMOS (Schmitt trigger mode) 80 mV 1.5 V LVCMOS (Schmitt trigger mode) 60 mV Table 2-101 • I/O Input Rise Time, Fall Time, and Related I/O Reliability Input Buffer Input Rise/Fall Time (min.) Input Rise/Fall Time (max.) Reliability LVTTL/LVCMOS (Schmitt trigger disabled) No requirement 10 ns* 20 years (100°C) LVTTL/LVCMOS (Schmitt trigger enabled) No requirement No requirement, but input noise voltage cannot exceed Schmitt hysteresis 20 years (100°C) HSTL/SSTL/GTL No requirement 10 ns* 10 years (100°C) LVDS/BLVDS/M-LVDS/LVPECL No requirement 10 ns* 10 years (100°C) Note: *The maximum input rise/fall time is related only to the noise induced into the input buffer trace. If the noise is low, the rise time and fall time of input buffers, when Schmitt trigger is disabled, can be increased beyond the maximum value. The longer the rise/fall times, the more susceptible the input signal is to the board noise. Microsemi recommends signal integrity evaluation/characterization of the system to ensure there is no excessive noise coupling into input signals. |
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