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AFS090 bảng dữ liệu(PDF) 184 Page - Microsemi Corporation |
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AFS090 bảng dữ liệu(HTML) 184 Page - Microsemi Corporation |
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184 / 334 page ![]() Device Architecture 2- 16 8 R e v isio n 2 Summary of I/O Timing Characteristics – Default I/O Software Settings Table 2-90 • Summary of AC Measuring Points Applicable to All I/O Bank Types Standard Input Reference Voltage (VREF_TYP) Board Termination Voltage (VTT_REF) Measuring Trip Point (Vtrip) 3.3 V LVTTL / 3.3 V LVCMOS – – 1.4 V 2.5 V LVCMOS – – 1.2 V 1.8 V LVCMOS – – 0.90 V 1.5 V LVCMOS – – 0.75 V 3.3 V PCI – – 0.285 * VCCI (RR) 0.615 * VCCI (FF)) 3.3 V PCI-X – – 0.285 * VCCI (RR) 0.615 * VCCI (FF) 3.3 V GTL 0.8 V 1.2 V VREF 2.5 V GTL 0.8 V 1.2 V VREF 3.3 V GTL+ 1.0 V 1.5 V VREF 2.5 V GTL+ 1.0 V 1.5 V VREF HSTL (I) 0.75 V 0.75 V VREF HSTL (II) 0.75 V 0.75 V VREF SSTL2 (I) 1.25 V 1.25 V VREF SSTL2 (II) 1.25 V 1.25 V VREF SSTL3 (I) 1.5 V 1.485 V VREF SSTL3 (II) 1.5 V 1.485 V VREF LVDS – – Cross point LVPECL – – Cross point Table 2-91 • I/O AC Parameter Definitions Parameter Definition tDP Data to Pad delay through the Output Buffer tPY Pad to Data delay through the Input Buffer with Schmitt trigger disabled tDOUT Data to Output Buffer delay through the I/O interface tEOUT Enable to Output Buffer Tristate Control delay through the I/O interface tDIN Input Buffer to Data delay through the I/O interface tPYS Pad to Data delay through the Input Buffer with Schmitt trigger enabled tHZ Enable to Pad delay through the Output Buffer—High to Z tZH Enable to Pad delay through the Output Buffer—Z to High tLZ Enable to Pad delay through the Output Buffer—Low to Z tZL Enable to Pad delay through the Output Buffer—Z to Low tZHS Enable to Pad delay through the Output Buffer with delayed enable—Z to High tZLS Enable to Pad delay through the Output Buffer with delayed enable—Z to Low |
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