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SCANSTA101SM/NOPB bảng dữ liệu(PDF) 32 Page - Texas Instruments

tên linh kiện SCANSTA101SM/NOPB
Giải thích chi tiết về linh kiện  SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master
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SCANSTA101
SNLS057J – MAY 2002 – REVISED APRIL 2013
www.ti.com
Table 36. Boundary Scan Register Definition
BSR
Signal Name
BSR
Signal Name
BSR
Signal Name
BSR
Signal Name
Bit#
Bit#
Bit#
Bit#
0
SCK
10
DTACK
20
DATA[7]
30
TCK_SM
1
RST
11
INT
21
DATA[6]
31
TRST0_SM
2
R/W
12
DATA[15]
22
DATA[5]
32
TDI_SM
3
STB
13
DATA[14]
23
DATA[4]
33
OE
4
CE
14
DATA[13]
24
DATA[3]
34
TRIST
5
ADDRESS[4]
15
DATA[12]
25
DATA[2]
6
ADDRESS[3]
16
DATA[11]
26
DATA[1]
7
ADDRESS[2]
17
DATA[10]
27
DATA[0]
8
ADDRESS[1]
18
DATA[9]
28
TDO_SM
9
ADDRESS[0]
19
DATA[8]
29
TMS_SM
BIST SUPPORT
The memory BIST can be initiated through JTAG interface using the RUNBIST instruction or by setting the
Onboard Memory BIST bit in the Start register. When the memory BIST is initiated through the JTAG interface
the result of pass/fail will be set in the Memory BIST Result bit in the Status register and also in the BIST status
register that can be accessed through the JTAG interface. The BIST status register is a one bit register and is
connected in the serial path of TDO and TDI when the RUNBIST instruction is scanned into the instruction
register. Once the BIST is done, the contents of the BIST status register can be scanned out to determine
whether the memory BIST passed or failed. If the memory BIST is initiated through the Onboard Memory BIST
bit in the Start register the result of pass/fail will be set only in the BIST Result bit in the status register. The
memory BIST will initialize the memory to zero.
32
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