LM5056, LM5056A

SNVS827A – OCTOBER 2012 – REVISED APRIL 2013

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ELECTRICAL CHARACTERISTICS

Limits in standard type are for TJ = 25°C only; limits in boldface type apply over the junction temperature (TJ) range of -40°C

to 125°C unless otherwise stated. Minimum and maximum limits are ensured through test, design, or statistical correlation.

Typical values represent the most likely parametric norm at TJ = 25°C, and are provided for reference purposes only. Unless

otherwise stated the following conditions apply: VIN = 48 V and VDD = 5.0 V. See

(1) and(2).

PARAMETER

TEST CONDITIONS

MIN

TYP

MAX

UNIT

Input (VIN Pin)

IVIN

VIN input current

VIN = 48 V

0.9

1.4

mA

Power on reset threshold at VIN to enable

POREN

VIN increasing

7.5

8.7

9.7

V

all functions

POREN_HY

POREN hysteresis

VIN decreasing

150

mV

S

VDD Regulator (VDD pin)

VDDPOR

VDD power on reset voltage threshold

VDD rising

3.0

3.8

4.5

V

IDD

VDD pin input current

VDD = 5.5 V

6.1

6.8

mA

OUT, SENSE, VIN_K, VAUX Pins

IOUT

OUT bias current

OUT = VIN, normal operation

79

90

ISENSE

SENSE bias current

SENSE = VIN, normal operation

11

μA

IVIN_K

VIN_K bias current

VIN_K = VIN, normal operation

110

IVAUX

VAUXH bias current

VAUX = 2.97 V

1.0

Internal Reference

VREF

Reference voltage

IREF = 0 mA

2.94

2.97

3.0

V

ADC and MUX

ADCRES

Resolution

12

bits

INL

Integral non-linearity

ADC only

±4

LSB

tRR

Acquisition round-robin time

Cycle all channels

1

ms

Remote Diode Temperature Sensor

Temperature accuracy using local diode

TA = 25°C to 85°C

2

°C

TACC

Remote diode resolution

9

bits

High level

250

IDIODE

External diode current source

μA

Low level

9.4

DRATIO

Diode current ratio

25.9

(1)

Current out of a pin is indicated as a negative value.

(2)

All limits are ensured. All electrical characteristics having room temperature limits are tested during production at TA = 25°C. All hot and

cold limits are ensured by correlating the electrical characteristics to process and temperature variations and applying statistical process

control.

4

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