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Table 41. 12-bit ADC characteristics (2.7 V to 3 V) (VREFH = VDDA, VREFL = VSS) 1
Symbol
Description
Min.
Typ.2
Max.
Unit
Notes
VDDA
Supply voltage
2.7
3
V
IDDA_ADC
Supply current per ADC
0.6
mA
3
SMPLTS
Sample Time
275
Refer to the
Reference
Manual
ns
TUE4
Total unadjusted error
±4
±8
LSB5
6, 7, 8, 9
DNL
Differential non-linearity
±1.0
LSB5
6, 7, 8, 9
INL
Integral non-linearity
±2.0
LSB5
6, 7, 8, 9
1. This table is not applicable to S32K14xW.
2. Typical values assume VDDA = 3 V, Temp = 25 °C, fADCK = 40 MHz, RAS=20 Ω, and CAS=10 nF.
3. The ADC supply current depends on the ADC conversion rate.
4. Represents total static error, which includes offset and full scale error.
5. 1 LSB = (VREFH - VREFL)/2N
6. The specifications are with averaging and in standalone mode only. Performance may degrade depending upon device
use case scenario. When using ADC averaging, refer to the Reference Manual to determine the most appropriate settings
for AVGS.
7. For ADC signals adjacent to VDD/VSS or XTAL/EXTAL or high frequency switching pins, some degradation in the ADC
performance may be observed.
8. All values guarantee the performance of the ADC for multiple ADC input channel pins. When using ADC to monitor the
internal analog parameters, assume minor degradation.
9. All the parameters in the table are given assuming system clock as the clocking source for ADC.
Table 42. 12-bit ADC characteristics (3 V to 5.5 V)(VREFH = VDDA, VREFL = VSS)
Symbol
Description
Min.
Typ.1
Max.
Unit
Notes
S32K1xx
S32K14xW
S32K1xx/
S32K14xW
S32K1xx/
S32K14xW
VDDA
Supply voltage
3
3.13
5.5
V
IDDA_ADC Supply current per ADC
1
mA
2
SMPLTS Sample Time
275
Refer to the
Reference
Manual
ns
TUE3
Total unadjusted error
±4
±8
LSB4
5, 6, 7, 8
DNL
Differential non-linearity
±0.7
LSB4
5, 6, 7, 8
INL
Integral non-linearity
±1.0
LSB4
5, 6, 7, 8
1. Typical values assume VDDA = 5.0 V, Temp = 25 °C, fADCK = 40 MHz, RAS=20 Ω, and CAS=10 nF unless otherwise stated.
2. The ADC supply current depends on the ADC conversion rate.
3. Represents total static error, which includes offset and full scale error.
4. 1 LSB = (VREFH - VREFL)/2N
5. The specifications are with averaging and in standalone mode only. Performance may degrade depending upon device
use case scenario. When using ADC averaging, refer to the Reference Manual to determine the most appropriate settings
for AVGS.
6. For ADC signals adjacent to VDD/VSS or XTAL/EXTAL or high frequency switching pins, some degradation in the ADC
performance may be observed.
7. All values guarantee the performance of the ADC for multiple ADC input channel pins. When using ADC to monitor the
internal analog parameters, assume minor degradation.
8. All the parameters in the table are given assuming system clock as the clocking source for ADC.
ADC electrical specifications
S32K1xx Data Sheet, Rev. 12, 02/2020
58
NXP Semiconductors



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