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ASP00886IRGCR bảng dữ liệu(PDF) 7 Page - Texas Instruments |
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ASP00886IRGCR bảng dữ liệu(HTML) 7 Page - Texas Instruments |
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7 / 139 page ![]() Changes from revision L to revision M Changes from June 17, 2013 to November 2, 2015 Page • Added Device Information table..........................................................................................................................2 • Added Section 4 and moved all functional block diagrams to it..........................................................................3 • Added Section 6 and moved Table 6-1 table to it............................................................................................... 9 • Added Section 8.2, ESD Ratings .....................................................................................................................22 • Moved Section 8.6, Thermal Resistance Characteristics ................................................................................ 26 • Changed the TYP value of CL,eff with Test Conditions of "XTS = 0, XCAPx = 0" from 2 pF to 1 pF.................31 • Corrected MRG0 and MRG1 bit names in fMCLK,MRG parameter description................................................... 52 • Corrected spelling of NMIIFG in Table 9-9, System Module Interrupt Vector Registers .................................. 62 • Corrected register names (added "USB" prefix as necessary) in Table 9-45, USB Control Registers ............ 70 • Changed P5.3 schematic (added P5SEL.2 and XT2BYPASS inputs, AND gate, and OR gate after P5SEL.3).. 92 • Changed P5SEL.3 column from X to 0 for "P5.3 (I/O)" rows............................................................................92 • Changed P5.5 schematic (change input from P5SEL.5 to P5SEL.4 and added P5SEL.5 input and the following OR gate)............................................................................................................................................ 94 • Changed P5SEL.5 column from X to 0 for "P5.5 (I/O)" rows............................................................................94 • Added Section 11, Mechanical, Packaging, and Orderable Information ........................................................121 The following table lists the changes to this data sheet from the initial release through revision L. REVISION DESCRIPTION SLAS590L June 2013 Production release of F5226 and F5224 in YFF package. Section 7.2, Added note regarding pullup resistor on RST/NMI/SBWTDIO pin. Figure 7-6, Added ball-side view and changed top-side view. SLAS590K February 2013 Section 8.48, Changed IERASE and IMERASE values. SLAS590J December 2012 Section 8.3, Added TYP test conditions Section 8.19, Added note (1) Section 8.48, Restored Flash erase currents to previous values (changed from TBD). SLAS590I August 2012 Changed MSP430F5528IYFF to Production Data. Section 7.2, Changed PUR pin description. Section 9.5.1, Added note regarding PUR pin. Table 9-9, Changed SYSRSTIV interrupt event with value 1Ch to Reserved. Section 8.3, Added note regarding interaction between minimum VCC and SVSH. Section 8.39, Changed tSENSOR(sample) MIN to 100 µs, and changed note (2). SLAS590H February 2012 Corrected lost and corrupted symbols throughout. Affected symbols include: Δ θ Ω → ≥ ≤ ≠ Changed ACLK signal description in Section 7.2. Changed note on Section 8.37. Changed notes regarding UCA0CLK and UCB0CLK function on Table 9-47 and Table 9-48. www.ti.com MSP430F5529, MSP430F5528, MSP430F5527, MSP430F5526, MSP430F5525, MSP430F5524, MSP430F5522, MSP430F5521, MSP430F5519, MSP430F5517, MSP430F5515, MSP430F5514, MSP430F5513 SLAS590P – MARCH 2009 – REVISED SEPTEMBER 2020 Copyright © 2020 Texas Instruments Incorporated Submit Document Feedback 7 Product Folder Links: MSP430F5529 MSP430F5528 MSP430F5527 MSP430F5526 MSP430F5525 MSP430F5524 MSP430F5522 MSP430F5521 MSP430F5519 MSP430F5517 MSP430F5515 MSP430F5514 MSP430F5513 |
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