MXT1664T3-ABESSQTP datasheet(71/98 Pages) MICROCHIP

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MXT1664T3 2.0

 2018 Microchip Technology Inc.

DS40002054A-page 71

14.3

Test Configuration

The configuration values listed below were used in the reference unit to validate the interfaces and derive the

characterization data provided in the following sections.

TABLE 14-1:

TEST CONFIGURATION

Object/Parameter

Description/Setting

Acquisition Configuration T8

CHRGTIME

MEASALLOW

MEASIDLEDEF

MEASACTVDEF

GPIO Configuration T19

Object Enabled

Self Test T25

Object Enabled

CTE Configuration T46

IDLESYNCSPERX

ACTVSYNCSPERX

Passive Stylus T47

Object Enabled

Shieldless T56

Object Enabled

INTTIME

Lens Bending T65

Object Enabled

Noise Suppression T72

Object Enabled

CTE Scan Configuration T77

Object Enabled

Glove Detection T78

Object Enabled

Retransmission Compensation T80

Object Enabled

Multiple Touch Touchscreen T100

Object Enabled

XSIZE

YSIZE

Auxiliary Touch Configuration T104

Object Enabled

Self Capacitance Noise Suppression T108

Object Enabled

Self Capacitance Configuration T111 Instance 0

INTTIME

IDLESYNCSPERL

ACTVSYNCSPERL

Self Capacitance Configuration T111 Instance 1

INTTIME

IDLESYNCSPERL

ACTVSYNCSPERL

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