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STM8T141 bảng dữ liệu(PDF) 35 Page - STMicroelectronics

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STM8T141 bảng dữ liệu(HTML) 35 Page - STMicroelectronics

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STM8T141
Electrical characteristics
Doc ID 15699 Rev 7
35/50
9.6
EMC characteristics
Susceptibility and emission tests are performed on a sample basis during product
characterization.
Both the sample and its applicative hardware environment (Figure 10) are mounted on a
dedicated specific EMC board defined in the IEC61967-1 standard.
9.6.1
Functional EMS (electromagnetic susceptibility)
While running in the above described environment the product is stressed by two
electromagnetic events until a failure occurs.
ESD: Electrostatic discharge (positive and negative) is applied on all pins of the device
until a functional disturbance occurs. This test complies with the IEC 1000-4-2
standard.
FTB: A burst of fast transient voltage (positive and negative) is applied to VDD and VSS
through a 100 pF capacitor, until a functional disturbance occurs. This test complies
with the IEC 1000-4-4 standard.
A device reset allows normal operations to be resumed. The test results are given in
Table 19 based on the EMS levels and classes defined in application note AN1709.
9.6.2
Prequalification trials
Table 19.
EMS data
Symbol
Parameter
Conditions
Level/class
VFESD
Voltage limits to be applied on any pin to
induce a functional disturbance
VDD 5 V, TA+25 °C, SO8
(Narrow) package, complies
with IEC 1000-4-2
1B
VEFTB
Fast transient voltage burst limits to be
applied through 100pF on VDD and VSS pins
to induce a functional disturbance
VDD5 V, TA+25 °C, SO8
(Narrow) package, complies
with IEC 1000-4-4
4A



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